Patents by Inventor Hsiu C. Ma

Hsiu C. Ma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method of test mode gate operation
    Patent number: 8381144
    Abstract: A system and method to select a gate to be modified as a test isolation gate is disclosed. In a particular embodiment, a method includes, after a layout phase of generating a design of a circuit, receiving timing information related to the design of the circuit. The method also includes selectively identifying at least one gate of a combinational logic portion of the design of the circuit to be modified to respond to a test enable signal, the at least one gate identified at least partially based on the timing information. The method also includes modifying the at least one gate. The at least one modified gate is fixed at a constant level during a test mode and is dynamically changeable during a functional mode of operation of the circuit.
    Type: Grant
    Filed: March 3, 2010
    Date of Patent: February 19, 2013
    Assignee: QUALCOMM Incorporated
    Inventors: Frederick C. Jen, Li Qiu, Hsiu C. Ma, Calvin V. Ho, Xiang M. Song, Hsiaohui Wu, Thomas E. Little
  • System and Method of Test Mode Gate Operation
    Publication number: 20110219277
    Abstract: A system and method to select a gate to be modified as a test isolation gate is disclosed. In a particular embodiment, a method includes, after a layout phase of generating a design of a circuit, receiving timing information related to the design of the circuit. The method also includes selectively identifying at least one gate of a combinational logic portion of the design of the circuit to be modified to respond to a test enable signal, the at least one gate identified at least partially based on the timing information. The method also includes modifying the at least one gate. The at least one modified gate is fixed at a constant level during a test mode and is dynamically changeable during a functional mode of operation of the circuit.
    Type: Application
    Filed: March 3, 2010
    Publication date: September 8, 2011
    Applicant: QUALCOMM INCORPORATED
    Inventors: Frederick C. Jen, Li Qiu, Hsiu C. Ma, Calvin V. Ho, Xiang M. Song, Hsiaohui Wu, Thomas E. Little