Patents by Inventor Hsiu-Ming Yeh
Hsiu-Ming Yeh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11810643Abstract: A word line driving circuit includes a first circuit and a second circuit. The first circuit is configured to provide a first word line driving voltage and a second word line driving voltage based on a first control signal, a second control signal, a first bias voltage, a second bias voltage and a base voltage. The second circuit is configured to provide the first control signal and the second control signal based on a third control signal, a fourth control signal, a word line control signal, a reverse word line control signal, the first bias voltage, the second bias voltage and the base voltage. The first bias voltage and the second bias voltage have different levels during the read mode and the program mode for adaptively adjusting the read voltage and the program voltage, thereby improving the data access time.Type: GrantFiled: January 5, 2022Date of Patent: November 7, 2023Assignee: UNITED MICROELECTRONICS CORP.Inventors: Chia-Wei Ho, Min-Chia Wang, Hsiu-Ming Yeh, Chung-Ming Lin
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Publication number: 20230274929Abstract: A method for processing a semiconductor wafer is provided. The method includes polishing the semiconductor wafer with a chemical mechanical polishing (CMP) tool. The method includes transferring the polished semiconductor wafer to an interface tool from the CMP tool. The method includes discharging a mist spray over the polished semiconductor wafer in the interface tool. The method includes transferring the semiconductor wafer form the interface tool to a cleaning tool for a cleaning process.Type: ApplicationFiled: May 4, 2023Publication date: August 31, 2023Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chih-I PENG, Hsiu-Ming YEH, Yi-Chang LIU
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Patent number: 11682552Abstract: A system for performing a chemical mechanical polishing (CMP) process is provided. The system includes a CMP tool configured to polish a semiconductor wafer. The processing system further includes a wafer stage configured to support the semiconductor wafer for facilitating the insertion of the semiconductor wafer into, and its subsequent removal from, the CMP tool. The processing system also includes a number of spray nozzles positioned relative to the wafer stage. In addition, the processing system includes a spray generator connected to the spray nozzles and configured to convert a mixture to a mist spray. The processing system further includes a controller configured to activate flow of the mist spray from the spray generator to the spray nozzles to discharge the mist spray over the semiconductor wafer supported by the wafer stage.Type: GrantFiled: October 21, 2019Date of Patent: June 20, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Chih-I Peng, Hsiu-Ming Yeh, Yi-Chang Liu
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Publication number: 20230178128Abstract: A word line driving circuit includes a first circuit and a second circuit. The first circuit is configured to provide a first word line driving voltage and a second word line driving voltage based on a first control signal, a second control signal, a first bias voltage, a second bias voltage and a base voltage. The second circuit is configured to provide the first control signal and the second control signal based on a third control signal, a fourth control signal, a word line control signal, a reverse word line control signal, the first bias voltage, the second bias voltage and the base voltage. The first bias voltage and the second bias voltage have different levels during the read mode and the program mode for adaptively adjusting the read voltage and the program voltage, thereby improving the data access time.Type: ApplicationFiled: January 5, 2022Publication date: June 8, 2023Applicant: UNITED MICROELECTRONICS CORP.Inventors: Chia-Wei Ho, Min-Chia Wang, Hsiu-Ming Yeh, Chung-Ming Lin
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Publication number: 20200051809Abstract: A system for performing a chemical mechanical polishing (CMP) process is provided. The system includes a CMP tool configured to polish a semiconductor wafer. The processing system further includes a wafer stage configured to support the semiconductor wafer for facilitating the insertion of the semiconductor wafer into, and its subsequent removal from, the CMP tool. The processing system also includes a number of spray nozzles positioned relative to the wafer stage. In addition, the processing system includes a spray generator connected to the spray nozzles and configured to convert a mixture to a mist spray. The processing system further includes a controller configured to activate flow of the mist spray from the spray generator to the spray nozzles to discharge the mist spray over the semiconductor wafer supported by the wafer stage.Type: ApplicationFiled: October 21, 2019Publication date: February 13, 2020Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Chih-I PENG, Hsiu-Ming YEH, Yi-Chang LIU
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Patent number: 10460926Abstract: A method for processing a semiconductor wafer is provided. The method includes transferring the semiconductor wafer from an interface tool to a Chemical Mechanical Polishing (CMP) tool. The method further includes polishing the semiconductor wafer with the CMP tool. The method also includes transferring the semiconductor wafer back to the interface tool from the CMP tool. In addition, the method includes converting a mixture to a mist spray and discharging the mist spray over the semiconductor wafer in the interface tool after the semiconductor wafer is polished by the CMP tool.Type: GrantFiled: April 27, 2018Date of Patent: October 29, 2019Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Chih-I Peng, Hsiu-Ming Yeh, Yi-Chang Liu
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Publication number: 20190157071Abstract: A method for processing a semiconductor wafer is provided. The method includes transferring the semiconductor wafer from an interface tool to a Chemical Mechanical Polishing (CMP) tool. The method further includes polishing the semiconductor wafer with the CMP tool. The method also includes transferring the semiconductor wafer back to the interface tool from the CMP tool. In addition, the method includes converting a mixture to a mist spray and discharging the mist spray over the semiconductor wafer in the interface tool after the semiconductor wafer is polished by the CMP tool.Type: ApplicationFiled: April 27, 2018Publication date: May 23, 2019Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Chih-I PENG, Hsiu-Ming YEH, Yi-Chang LIU
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Patent number: 9908213Abstract: A method of using a chemical mechanical polishing (CMP)apparatus that includes a apparatus is provided. The method includes providing a conditioning disc for conditioning the polishing pad, where the conditioning disc includes a plurality of portions of subsystem discs. The portions may be regions of the disc that are concentric. Each portion of the disc is operable to rotate at a different angular velocity. In some embodiments, a different applied loading is provided to each of the portions of the disc in addition to or in lieu of the different angular velocities.Type: GrantFiled: October 5, 2015Date of Patent: March 6, 2018Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Hsiu-Ming Yeh, Feng-Inn Wu
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Patent number: 9836093Abstract: An electronic apparatus includes a host, a touch control screen, a pivot unit, a retaining unit, and a control unit. The retaining unit includes a driving member electrically operable to drive a retaining member to move between a retaining position and a non-retaining position. The control unit controls, according to an operation signal corresponding to a status of the touch control screen, the driving member to drive the retaining member to either move to the retaining position for resisting rotation of the touch control screen relative to the host, or move to the non-retaining position for not resisting rotation of the touch control screen relative to the host.Type: GrantFiled: January 8, 2015Date of Patent: December 5, 2017Assignee: WISTRON CORPORATIONInventors: Yen-Chi Chen, Hsiu-Ming Yeh
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Publication number: 20160023324Abstract: A chemical mechanical polishing (CMP) apparatus is provided that includes a conditioning disc for conditioning a polishing pad of the CMP apparatus. The conditioning disc includes a plurality of portions of subsystem discs. The portions may be regions of the disc that are concentric. Each portion of the disc is operable to rotate at a different angular velocity. In some embodiments, a different applied loading is provided to each of the portions of the disc in addition to or in lieu of the different angular velocities.Type: ApplicationFiled: October 5, 2015Publication date: January 28, 2016Inventors: Hsiu-Ming Yeh, Feng-Inn Wu
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Publication number: 20160004366Abstract: An electronic apparatus includes a host, a touch control screen, a pivot unit, a retaining unit, and a control unit. The retaining unit includes a driving member electrically operable to drive a retaining member to move between a retaining position and a non-retaining position. The control unit controls, according to an operation signal corresponding to a status of the touch control screen, the driving member to drive the retaining member to either move to the retaining position for resisting rotation of the touch control screen relative to the host, or move to the non-retaining position for not resisting rotation of the touch control screen relative to the host.Type: ApplicationFiled: January 8, 2015Publication date: January 7, 2016Inventors: Yen-Chi Chen, Hsiu-Ming Yeh
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Patent number: 9149906Abstract: A chemical mechanical polishing (CMP) apparatus is provided that includes a conditioning disc for conditioning a polishing pad of the CMP apparatus. The conditioning disc includes a plurality of portions of subsystem discs. The portions may be regions of the disc that are concentric. Each portion of the disc is operable to rotate at a different angular velocity. In some embodiments, a different applied loading is provided to each of the portions of the disc in addition to or in lieu of the different angular velocities.Type: GrantFiled: September 7, 2011Date of Patent: October 6, 2015Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Hsiu-Ming Yeh, Feng-Inn Wu
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Publication number: 20130059503Abstract: A chemical mechanical polishing (CMP) apparatus is provided that includes a conditioning disc for conditioning a polishing pad of the CMP apparatus. The conditioning disc includes a plurality of portions of subsystem discs. The portions may be regions of the disc that are concentric. Each portion of the disc is operable to rotate at a different angular velocity. In some embodiments, a different applied loading is provided to each of the portions of the disc in addition to or in lieu of the different angular velocities.Type: ApplicationFiled: September 7, 2011Publication date: March 7, 2013Applicant: Taiwan Semiconductor Manufacturing Company, Ltd. ("TSMC")Inventors: Hsiu-Ming Yeh, Feng-Inn Wu