Patents by Inventor Hsueh-Wei CHIU

Hsueh-Wei CHIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical system
    Patent number: 11934027
    Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.
    Type: Grant
    Filed: June 21, 2022
    Date of Patent: March 19, 2024
    Assignee: TDK TAIWAN CORP.
    Inventors: Chao-Chang Hu, Chih-Wei Weng, Chia-Che Wu, Chien-Yu Kao, Hsiao-Hsin Hu, He-Ling Chang, Chao-Hsi Wang, Chen-Hsien Fan, Che-Wei Chang, Mao-Gen Jian, Sung-Mao Tsai, Wei-Jhe Shen, Yung-Ping Yang, Sin-Hong Lin, Tzu-Yu Chang, Sin-Jhong Song, Shang-Yu Hsu, Meng-Ting Lin, Shih-Wei Hung, Yu-Huai Liao, Mao-Kuo Hsu, Hsueh-Ju Lu, Ching-Chieh Huang, Chih-Wen Chiang, Yu-Chiao Lo, Ying-Jen Wang, Shu-Shan Chen, Che-Hsiang Chiu
  • Low-cost test/calibration system and calibrated device for low-cost test/calibration system
    Patent number: 9525500
    Abstract: A test/calibration system includes a device under test (DUT) and a calibrated device. The calibrated device is coupled to the DUT, transmits or receives a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.
    Type: Grant
    Filed: November 30, 2015
    Date of Patent: December 20, 2016
    Assignee: MEDIATEK INC.
    Inventors: Jen-Yang Liu, I-Cheng Tsai, Hsueh-Wei Chiu, Yuan-Hwui Chung, Chun-Hsien Peng
  • LOW-COST TEST/CALIBRATION SYSTEM AND CALIBRATED DEVICE FOR LOW-COST TEST/CALIBRATION SYSTEM
    Publication number: 20160112148
    Abstract: A test/calibration system includes a device under test (DUT) and a calibrated device. The calibrated device is coupled to the DUT, transmits or receives a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.
    Type: Application
    Filed: November 30, 2015
    Publication date: April 21, 2016
    Inventors: Jen-Yang LIU, I-Cheng TSAI, Hsueh-Wei CHIU, Yuan-Hwui CHUNG, Chun-Hsien PENG