Patents by Inventor Hua Ai Zeng

Hua Ai Zeng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10867625
    Abstract: A spin transfer torque (STT) device has a free ferromagnetic layer that includes a Heusler alloy layer and a template layer beneath and in contact with the Heusler alloy layer. The template layer may be a ferromagnetic alloy comprising one or more of Co, Ni and Fe and the element X, where X is selected from one or more of Ta, B, Hf, Zr, W, Nb and Mo. A CoFe nanolayer may be formed below and in contact with the template layer. The STT device may be a spin-torque oscillator (STO), like a STO incorporated into the write head of a magnetic recording disk drive. The STT device may also be a STT in-plane or perpendicular magnetic tunnel junction (MTJ) cell for magnetic random access memory (MRAM). The template layer reduces the critical current density of the STT device.
    Type: Grant
    Filed: February 27, 2020
    Date of Patent: December 15, 2020
    Assignee: WESTERN DIGITAL TECHNOLOGIES, INC
    Inventors: James Mac Freitag, Zheng Gao, Masahiko Hashimoto, Sangmun Oh, Hua Ai Zeng
  • Publication number: 20190279667
    Abstract: A spin transfer torque (STT) device has a free ferromagnetic layer that includes a Heusler alloy layer and a template layer beneath and in contact with the Heusler alloy layer. The template layer may be a ferromagnetic alloy comprising one or more of Co, Ni and Fe and the element X, where X is selected from one or more of Ta, B, Hf, Zr, W, Nb and Mo. A CoFe nanolayer may be formed below and in contact with the template layer. The STT device may be a spin-torque oscillator (STO), like a STO incorporated into the write head of a magnetic recording disk drive. The STT device may also be a STT in-plane or perpendicular magnetic tunnel junction (MTJ) cell for magnetic random access memory (MRAM). The template layer reduces the critical current density of the STT device.
    Type: Application
    Filed: May 10, 2018
    Publication date: September 12, 2019
    Applicant: WESTERN DIGITAL TECHNOLOGIES, INC.
    Inventors: JAMES MAC FREITAG, ZHENG GAO, MASAHIKO HASHIMOTO, SANGMUN OH, HUA AI ZENG
  • Patent number: 8817426
    Abstract: A magnetic read sensor having improved magnetic performance and robustness. The magnetic sensor includes a magnetic free layer and a magnetic pinned layer structure. The magnetic pinned layer structure includes first and second magnetic layers separated from one another by a non-magnetic coupling layer. The second magnetic layer of the magnetic pinned layer structure includes a layer of CoFeBTa, which prevents the diffusion of atoms and also promotes a desired BCC crystalline grain growth. The magnetic free layer structure can also include such a CoFeBTa layer for further prevention of atomic diffusion and further promotion of a desired BCC grain growth.
    Type: Grant
    Filed: October 17, 2011
    Date of Patent: August 26, 2014
    Assignee: HGST Netherlands B.V.
    Inventors: Zheng Gao, Yingfan Xu, Hua Ai Zeng
  • Publication number: 20130094108
    Abstract: A magnetic read sensor having improved magnetic performance and robustness. The magnetic sensor includes a magnetic free layer and a magnetic pinned layer structure. The magnetic pinned layer structure includes first and second magnetic layers separated from one another by a non-magnetic coupling layer. The second magnetic layer of the magnetic pinned layer structure includes a layer of CoFeBTa, which prevents the diffusion of atoms and also promotes a desired BCC crystalline grain growth. The magnetic free layer structure can also include such a CoFeBTa layer for further prevention of atomic diffusion and further promotion of a desired BCC grain growth.
    Type: Application
    Filed: October 17, 2011
    Publication date: April 18, 2013
    Applicant: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Zheng Gao, Yingfan Xu, Hua Ai Zeng
  • Patent number: 7676904
    Abstract: A method of manufacturing a GMR, TMR or CPP GMR sensor having a smooth interface between magnetic and non-magnetic layers to improve sensor performance by exposing a layer to a low energy ion beam prior to depositing a subsequent layer.
    Type: Grant
    Filed: July 30, 2004
    Date of Patent: March 16, 2010
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Phong V. Chau, James Mac Freitag, Mustafa Michael Pinarbasi, Hua Ai Zeng
  • Patent number: 7111385
    Abstract: A method for improving hard bias properties of layers of a magnetoresistance sensor is disclosed. Properties of the hard bias layer are improved using a seedlayer structure that includes at least a first layer of silicon and a second layer comprising chromium or chromium molybdenum. Further, benefits are achieved when the seedlayer structure includes a layer of tantalum.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: September 26, 2006
    Assignee: Hitachi Global Storage Technologies
    Inventors: Phong V. Chau, James Mac Freitag, Mustafa Michael Pinarbasi, Hua Ai Zeng, Howard Gordon Zolla
  • Patent number: 7038892
    Abstract: An apparatus having improved hard bias properties of layers of a magnetoresistance sensor is disclosed. Properties of the hard bias layer are improved using a seedlayer structure that includes at least a layer of silicon and a layer comprising chromium or chromium molybdenum. Further, benefits are achieved when the seedlayer structure includes a layer of tantalum.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: May 2, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands, B.V.
    Inventors: Phong V. Chau, James Mac Freitag, Mustafa Michael Pinarbasi, Hua Ai Zeng, Howard Gordon Zolla