Abstract: Methods of cutting gate structures and fins, and structures formed thereby, are described. In an embodiment, a substrate includes first and second fins and an isolation region. The first and second fins extend longitudinally parallel, with the isolation region disposed therebetween. A gate structure includes a conformal gate dielectric over the first fin and a gate electrode over the conformal gate dielectric. A first insulating fill structure abuts the gate structure and extends vertically from a level of an upper surface of the gate structure to at least a surface of the isolation region. No portion of the conformal gate dielectric extends vertically between the first insulating fill structure and the gate electrode. A second insulating fill structure abuts the first insulating fill structure and an end sidewall of the second fin. The first insulating fill structure is disposed laterally between the gate structure and the second insulating fill structure.

Abstract: A method for remote mask data jobview through a network featuring 24-hour service, reduced cycle time and lower cost, whereby customers can obtain real time mask data access instead of downloading entire pattern files. Expensive CAD/CAM software is unnecessary for the mask data jobview; instead, only a web browser is required. The method for remote mask data jobview through a network comprising the steps of: storing a mask data file to a jobview computer, wherein drawing software is installed on the jobview computer; logging onto a web server from a customer computer through a first network, wherein a web-based graphic mode emulator is installed on the web server; logging onto the jobview computer from the web server through a second network; using the web-base graphic mode emulator to operate the drawing software; and using a browser installed on the customer computer to operate the drawing software to open and review the mask data file.

Abstract: The present invention provides a method and a system for measuring critical dimensions of a mask design pattern. The method includes: setting up a server comprising a measure system; establishing a connection between the server and a remote terminal through the Internet; and utilizing the remote terminal to login the server so as to transmit the mask design pattern to the server and remotely control the measure system to measure the critical dimensions of the mask design pattern.

Abstract: The present invention provides a method and a system for online real-time query about a current status of an optical component. The method includes setting up a database and utilizing the database for recording information about the current status of the optical component, wherein the information includes a manufacturing status of the optical component. The method also includes establishing a connection between the database and a remote terminal through the Internet and utilizing the remote terminal to read the information stored in the database for acquiring the current status of the optical component.