Patents by Inventor Hua-fen Liu

Hua-fen Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Intelligent saturation control for compound specific optimization of MRM
    Patent number: 8335655
    Abstract: Mass spectrometer parameters used to tune a mass spectrometer for multiple reaction monitoring (MRM) are determined from a single injection of a sample. Two or more precursor ion scans and a plurality of product ion scans for each precursor ion scan are performed from the injection. Each precursor ion scan is produced with different mass spectrometer parameters that create a different level of ion current. The mass spectra of the precursor ion scans are analyzed to determine if saturation has occurred in any of the precursor ion scans. A precursor ion scan that produces the highest ion current with the least amount of saturation is selected. The mass spectrometer parameters used to tune the mass spectrometer for MRM are determined from (1) the mass spectrometer parameters of the selected precursor ion scan and (2) the mass spectrometer parameters of product ion scans from fragments of the selected precursor ion scan.
    Type: Grant
    Filed: June 1, 2009
    Date of Patent: December 18, 2012
    Assignee: DH Technologies Development Pte. Ltd.
    Inventors: Loren Y. Olson, Anthony J. Romanelli, John Joseph Gibbons, April L. Thomas, Elliott B. Jones, Hua-fen Liu
  • INTELLIGENT SATURATION CONTROL FOR COMPOUND SPECIFIC OPTIMIZATION OF MRM
    Publication number: 20090299671
    Abstract: Mass spectrometer parameters used to tune a mass spectrometer for multiple reaction monitoring (MRM) are determined from a single injection of a sample. Two or more precursor ion scans and a plurality of product ion scans for each precursor ion scan are performed from the injection. Each precursor ion scan is produced with different mass spectrometer parameters that create a different level of ion current. The mass spectra of the precursor ion scans are analyzed to determine if saturation has occurred in any of the precursor ion scans. A precursor ion scan that produces the highest ion current with the least amount of saturation is selected. The mass spectrometer parameters used to tune the mass spectrometer for MRM are determined from (1) the mass spectrometer parameters of the selected precursor ion scan and (2) the mass spectrometer parameters of product ion scans from fragments of the selected precursor ion scan.
    Type: Application
    Filed: June 1, 2009
    Publication date: December 3, 2009
    Inventors: Elliot B. Jones, Hua-Fen Liu, Loren Y. Olson, Anthony J. Romanelli, John Joseph Gibbons, April L. Thomas