Abstract: This application relates to an image data inspection method and apparatus in the field of artificial intelligence (AI) technologies. The method includes obtaining an image to be inspected, the image to be inspected comprising a sequence of slice images; determining a corresponding group of slice images for each target image in the sequence of slice images; extracting a corresponding slice feature map for each slice image in the group of slice images; aligning the slice feature maps extracted corresponding to the group of slice images; aggregating context information of each slice image in the group of slice images by using an aligned feature map; and performing target region inspection on an aggregated feature map, to obtain an inspection result corresponding to the target image, and combining the inspection result corresponding to each target image, to generate an inspection result corresponding to the image to be inspected.