Abstract: A method for identifying a cause of manufacturing defects is provided. The method includes capturing, by an image capture unit, a number N of images from a semiconductor wafer, wherein each of the s umber N of images comprises a number M of geometric features, calculating, by a processing unit, a geometric center for each of the geometric features of the number N of images, calculating, based on the number N of images, a number M of average geometric centers associated with the number M of geometric features, and calculating a shift amount for each geometric feature of the number N of images.

Abstract: A system, method, and non-transitory computer-readable medium for identifying a cause of manufacturing defects are provided. The system includes a processing unit and an image capture unit electrically coupled to the processing unit. The system is configured to capture, by the image capture unit, a number N of images covering different portions of a semiconductor wafer, wherein each of the number N of images comprises a number M of geometric features. The system is further configured to specify a number M of serial numbers, each associated with one of the number M of geometric features. The system is further configured to calculate, by the processing unit, a geometric center for each of the geometric features of the number N of images. The system is further configured to calculate, based on the number N of images, a number M of average geometric centers associated with the number M of serial numbers.

Abstract: An electronic device includes a frame and a display stack. The frame defines a first part of an interior volume. The display stack includes a cover attached to the frame. The cover may define a second part of the interior volume. The display stack also includes an array of organic light-emitting diodes (OLEDs) including an array of emissive electroluminescent (EL) regions, and at least one organic photodetector (OPD) disposed between the cover and at least one emissive EL region in the array of emissive electroluminescent regions. The at least one emissive EL region emits light through the at least one OPD. In alternative embodiments, the OLEDs may be stacked on the OPDs, or the OLEDs and OPDs may be interspersed with each other instead of stacked.

Abstract: An electronic device may include a display and an optical sensor formed underneath the display. A pixel removal region on the display may at least partially overlap with the sensor. The pixel removal region may include a plurality of non-pixel regions each of which is devoid of thin-film transistors. The plurality of non-pixel regions is configured to increase the transmittance of light through the display to the sensor. In addition to removing thin-film transistors in the pixel removal region, additional layers in the display stack-up may be removed. In particular, a cathode layer, polyimide layer, and/or substrate in the display stack-up may be patterned to have an opening in the pixel removal region. A polarizer may be bleached in the pixel removal region for additional transmittance gains. The cathode layer may be removed using laser ablation with a spot laser or blanket illumination.

Abstract: An electronic device includes a frame and a display stack. The frame defines a first part of an interior volume. The display stack includes a cover attached to the frame. The cover may define a second part of the interior volume. The display stack also includes an array of organic light-emitting diodes (OLEDs) including an array of emissive electroluminescent (EL) regions, and at least one organic photodetector (OPD) disposed between the cover and at least one emissive EL region in the array of emissive electroluminescent regions. The at least one emissive EL region emits light through the at least one OPD. In alternative embodiments, the OLEDs may be stacked on the OPDs, or the OLEDs and OPDs may be interspersed with each other instead of stacked.

Abstract: Systems and methods for detection of incident light are described. An optical imaging sensor is positioned at least partially within an active display area of a display and is configured to detect and characterize one or more properties of light incident to the active display area of the display.

Abstract: Display structures for controlling viewing angle color shift are described. In various embodiments, polarization sensitive diffusers, independent controlled cathode thicknesses, filtermasks, touch detection layers, and color filters are described.

Abstract: An electronic device may have a display such as an organic light-emitting diode display. The display may have an active area formed from an array of pixels with light-emitting diodes. The light-emitting diodes may be formed from an organic layer containing emissive material between an anode layer and a cathode layer. Apertures may be formed in the active area of the display. The apertures may allow light to pass to light-sensitive components under the display. A polarizer may overlap the display and may have a bleached area that forms part of a camera aperture. Light may pass through the camera aperture to a camera under the display. The display may have an array of apertures that allow light to pass to a light-sensitive fingerprint sensor under the display.

Abstract: A device includes a display stack and an optical receiver. The display stack includes a set of opaque elements defining a translucent aperture. The translucent aperture extends through the display stack. The optical receiver is spaced apart from and behind a back surface of the display stack. At least one micro-optic element is formed on the back surface of the display stack, between the display stack and the optical receiver. The at least one micro-optic element includes a micro-optic element having a focal point located within the translucent aperture. The optical receiver is configured to receive light through the translucent aperture and the at least one micro-optic element.

Abstract: Systems and methods for detection of incident light are described. An optical imaging sensor is positioned at least partially within an active display area of a display and is configured to detect and characterize one or more properties of light incident to the active display area of the display.

Abstract: An electronic device may have a flexible organic light-emitting diode display layer. The edge of the flexible display layer may be bent. The display may have pixels formed from organic light-emitting diodes having anodes characterized by anode surface normals. For pixels in some regions of the display such as the bent edge of the display, the display may be characterized by a display surface normal for a pixel that differs from an anode surface normal for the anode of the organic light-emitting diode of that pixel. By tilting the anodes in this way, color shifts due to off-axis viewing of the pixels in the bend edge of the display can be minimized. If desired, tilted anodes may have multiple areas with different tilts. Sets of pixels with different anode tilts or other characteristics that differ may be supplied with common pixel data values.

Abstract: Display structures for controlling viewing angle color shift are described. In various embodiments, polarization sensitive diffusers, independent controlled cathode thicknesses, filtermasks, and color filters are described.

Abstract: Systems and methods for detection of incident light are described. An optical imaging sensor is positioned at least partially within an active display area of a display and is configured to detect and characterize one or more properties of light incident to the active display area of the display.

Abstract: Systems and methods for detection of incident light are described. An optical imaging sensor is positioned at least partially within an active display area of a display and is configured to detect and characterize one or more properties of light incident to the active display area of the display.

Abstract: Aspects of the subject technology relate to electronic devices with displays. The display includes an array of display pixels and one or more display-light sensors that monitor the display light generated by the display pixels. Using the display-light sensors, corrections to control signals for the display pixels can be provided to correct for array non-uniformities and/or pixel degradation over time. The display-light sensors may be provided in an array of display-light sensors mounted parallel to the array of display pixels. The array of display-light sensors can be in-plane with the display pixels or vertically displaced from the display pixels. The display-light sensors may be prevented from receiving non-display light such as ambient light.

Abstract: A device includes a display stack and an optical receiver. The display stack includes a set of opaque elements defining a translucent aperture. The translucent aperture extends through the display stack. The optical receiver is spaced apart from and behind a back surface of the display stack. At least one micro-optic element is formed on the back surface of the display stack, between the display stack and the optical receiver. The at least one micro-optic element includes a micro-optic element having a focal point located within the translucent aperture. The optical receiver is configured to receive light through the translucent aperture and the at least one micro-optic element.

Abstract: A display may have an array of pixels formed from organic light-emitting diodes and thin-film transistor circuitry. Each pixel may include organic layers interposed between an anode and a cathode. The organic layers may emit out-coupled light that escapes the display and waveguided light that is waveguided within the organic layers. A reflector may be placed at the edge of the organic layers to reflect the waveguided light out of the display. The reflector may be located within a pixel definition layer and may be formed from metal or may be formed from one or more interfaces between high-refractive-index material and low-refractive-index material. The reflector may be formed from an extended portion of the pixel anode. The reflector may be formed from light-reflecting particles that are suspended in the pixel definition layer.

Abstract: An electronic device may be provided with an ambient light sensor. The ambient light sensor may be a color ambient light sensor or a monochrome ambient light sensor. The electronic device may have a light-emitting component such as a display. During operation of the display, the display emits light. To reduce noise due to the emitted light while measuring ambient light, the ambient light sensor may have optical structures such as wave plates and polarizers. Theses optical structures may overlap light detectors. The optical structures may be configured to prevent ambient light from reaching a first of the light detectors while allowing ambient light to reach a second of the light detectors. The ambient light sensor may be configured to receive ambient light that has passed thorough an inactive area of a display or that has passed through a pixel array in an active area of a display.

Abstract: An electronic device may be provided with an ambient light sensor. The ambient light sensor may be a color ambient light sensor or a monochrome ambient light sensor. The electronic device may have a light-emitting component such as a display. During operation of the display, the display emits light. To reduce noise due to the emitted light while measuring ambient light, the ambient light sensor may have optical structures such as wave plates and polarizers. Theses optical structures may overlap light detectors. The optical structures may be configured to prevent ambient light from reaching a first of the light detectors while allowing ambient light to reach a second of the light detectors. The ambient light sensor may be configured to receive ambient light that has passed thorough an inactive area of a display or that has passed through a pixel array in an active area of a display.

Abstract: Display structures for controlling viewing angle color shift are described. In various embodiments, polarization sensitive diffusers, independent controlled cathode thicknesses, filtermasks, and color filters are described.