Patents by Inventor Huang-Zhong NI

Huang-Zhong NI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Batch automatic test method for solid state disks and batch automatic test device for solid state disks
    Patent number: 10768852
    Abstract: A batch automatic test method and a batch automatic test device for solid state disks are provided. The batch automatic test method is used for testing a plurality of solid state disks by a batch automatic test device. The solid state disks are coupled to the batch automatic test device. The batch automatic test method includes the following steps. A plurality of buses of the batch automatic test device are scanned to mark the solid state disks and a system disk. A piece of disk information of each of the solid state disks is shown. Each of the pieces of the disk information includes a disk location of each of the solid state disks. A formatting procedure is synchronously performed on the solid state disks according to the disk locations. After performing the formatting procedure, a burn-in test procedure is automatically and synchronously performed on the solid state disks.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: September 8, 2020
    Assignees: SHENZHEN SHICHUANGYI ELECTRONICS CO., LTD, SILICON MOTION, INC.
    Inventors: Huang-Zhong Ni, Jun Cheng
  • BATCH AUTOMATIC TEST METHOD FOR SOLID STATE DISKS AND BATCH AUTOMATIC TEST DEVICE FOR SOLID STATE DISKS
    Publication number: 20190272116
    Abstract: A batch automatic test method and a batch automatic test device for solid state disks are provided. The batch automatic test method is used for testing a plurality of solid state disks by a batch automatic test device. The solid state disks are coupled to the batch automatic test device. The batch automatic test method includes the following steps. A plurality of buses of the batch automatic test device are scanned to mark the solid state disks and a system disk. A piece of disk information of each of the solid state disks is shown. Each of the pieces of the disk information includes a disk location of each of the solid state disks. A formatting procedure is synchronously performed on the solid state disks according to the disk locations. After performing the formatting procedure, a burn-in test procedure is automatically and synchronously performed on the solid state disks.
    Type: Application
    Filed: February 28, 2019
    Publication date: September 5, 2019
    Applicants: SHENZHEN SHICHUANGYI ELECTRONICS CO., LTD, Silicon Motion, Inc.
    Inventors: Huang-Zhong NI, Jun CHENG