Patents by Inventor Huay Meei Liew

Huay Meei Liew has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110265821
    Abstract: Techniques and systems for maintaining a plasma processing kit consisting of protection and shielding elements without causing damage are introduced. The elements may be made of aluminium, polysilicon and quartz and may be coated with silicon. The surfaces of the elemants show a specified roughness. Precision cleaning and recovery of the contamined kit components of a plasma doping (PLAD) system is used, to extend the life and reusability of the components. The methods described cover the stages of inspection, pre-cleaning, mechanical processing and texturing, post-cleaning, clean-room class cleaning and packaging of the components consisting of quartz, aluminium and/or silicon. Techniques described employ the combination of a variety of means (primarily chemical and mechanical) to achieve the desired levels of cleanliness. The result obtained by methods that include Inductively Coupled Plasma-Mass Spectrometry (ICP-MS) and Laser Particle Count affirm the efficacy of these techniques.
    Type: Application
    Filed: August 28, 2009
    Publication date: November 3, 2011
    Inventors: Kiang Meng Tay, Eugapore Wei Khal Mah, Huay Meei Liew, Teck Kwang Tay, Chua Bong Lee, Shi Chai Chong, James Edward White, Rudolph John Caruso, Daniel Allen Simon, Elie Eid Rahme