Patents by Inventor Hubert WERKMANN

Hubert WERKMANN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test arrangement for testing high-frequency components, particularly silicon photonics devices under test
    Patent number: 11782072
    Abstract: The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a probe head (PH) on a first side thereof, and wherein the probe card (PC) is adapted to be attached to an interface (IF) and wherein the probe card (PC) comprises a plurality of contact pads on a second side in a region opposing at least a region of the interface (IF), arranged to contact a plurality of contacts of the interface (IF), and wherein the probe card (PC) comprises one or more coaxial connectors (CCPT) arranged to mate with one or more corresponding coaxial connectors (CCPT) of the interface (IF). The invention relates further to pogo tower (PT) for connecting a wafer probe interface (WPI) of an automatic test equipment with the probe card (PC).
    Type: Grant
    Filed: May 13, 2022
    Date of Patent: October 10, 2023
    Assignee: Advantest Corporation
    Inventors: José Moreira, Zhan Zhang, Hubert Werkmann, Fabio Pizza, Paolo Mazzucchelli
  • Test arrangement for testing high-frequency components, particularly silicon photonics devices under test
    Patent number: 11561242
    Abstract: The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a probe head (PH) on a first side thereof, and wherein the probe card (PC) is adapted to be attached to an interface (IF) and wherein the probe card (PC) comprises a plurality of contact pads on a second side in a region opposing at least a region of the interface (IF), arranged to contact a plurality of contacts of the interface (IF), and wherein the probe card (PC) comprises one or more coaxial connectors (CCPT) arranged to mate with one or more corresponding coaxial connectors (CCPT) of the interface (IF). The invention relates further to pogo tower (PT) for connecting a wafer probe interface (WPI) of an automatic test equipment with the probe card (PC).
    Type: Grant
    Filed: October 30, 2020
    Date of Patent: January 24, 2023
    Assignee: Advantest Corporation
    Inventors: José Moreira, Zhan Zhang, Hubert Werkmann, Fabio Pizza, Paolo Mazzucchelli
  • TEST ARRANGEMENT FOR TESTING HIGH-FREQUENCY COMPONENTS, PARTICULARLY SILICON PHOTONICS DEVICES UNDER TEST
    Publication number: 20220276280
    Abstract: The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a probe head (PH) on a first side thereof, and wherein the probe card (PC) is adapted to be attached to an interface (IF) and wherein the probe card (PC) comprises a plurality of contact pads on a second side in a region opposing at least a region of the interface (IF), arranged to contact a plurality of contacts of the interface (IF), and wherein the probe card (PC) comprises one or more coaxial connectors (CCPT) arranged to mate with one or more corresponding coaxial connectors (CCPT) of the interface (IF). The invention relates further to pogo tower (PT) for connecting a wafer probe interface (WPI) of an automatic test equipment with the probe card (PC).
    Type: Application
    Filed: May 13, 2022
    Publication date: September 1, 2022
    Inventors: José MOREIRA, Zhan ZHANG, Hubert WERKMANN, Fabio Pizza, Paolo MAZZUCCHELLI
  • TEST ARRANGEMENT FOR TESTING HIGH-FREQUENCY COMPONENTS, PARTICULARLY SILICON PHOTONICS DEVICES UNDER TEST
    Publication number: 20210302470
    Abstract: The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a probe head (PH) on a first side thereof, and wherein the probe card (PC) is adapted to be attached to an interface (IF) and wherein the probe card (PC) comprises a plurality of contact pads on a second side in a region opposing at least a region of the interface (IF), arranged to contact a plurality of contacts of the interface (IF), and wherein the probe card (PC) comprises one or more coaxial connectors (CCPT) arranged to mate with one or more corresponding coaxial connectors (CCPT) of the interface (IF). The invention relates further to pogo tower (PT) for connecting a wafer probe interface (WPI) of an automatic test equipment with the probe card (PC).
    Type: Application
    Filed: October 30, 2020
    Publication date: September 30, 2021
    Inventors: José MOREIRA, Zhan ZHANG, Hubert WERKMANN, Fabio Pizza, Paolo MAZZUCCHELLI