Abstract: Systems, methods and devices are provided, which can include an engineering change order (ECO) base. A base layout cell includes metal layer regions, conductive gate patterns arranged above metal layer regions; oxide definition (OD) patterns, metal-zero layer over oxide-definition (metal-zero) patterns, at least one cut metal layer (CMD) pattern; and at least one via region. The base layout cell can be implemented in at least two non-identical functional cells. A first functional cell of the at least two non-identical functional cells includes first interconnection conductive patterns arranged connecting metal-zero structures corresponding to at least two metal-zero patterns in a first layout, and a second functional cell of the at least two non-identical functional cells includes second interconnection conductive patterns arranged connecting metal-zero structures corresponding to at least two metal-zero patterns in a second layout.

Abstract: A testing equipment with a magnifying function includes a carrier, a cover and a magnifying part. The carrier has a specimen holding area formed on the top of the carrier. The cover is stacked on the specimen holding area of the carrier. The magnifying part disposed on the cover. The location of the magnifying part is corresponding to the location of the specimen holding area. The testing equipment of the present application has a simplified and cheap structure for a simple specimen testing.

Abstract: A testing equipment with a magnifying function includes a carrier, a cover and a magnifying part. The carrier has a specimen holding area formed on the top of the carrier. The cover is stacked on the specimen holding area of the carrier. The magnifying part disposed on the cover. The location of the magnifying part is corresponding to the location of the specimen holding area. The testing equipment of the present application has a simplified and cheap structure for a simple specimen testing.

Abstract: This invention relates to a device and method for optical nanoindentation measurement, according to which respective measurement results are obtained by having an indenter tip apply load to a fixed portion of a thin film, having an indenter tip apply load to a non-fixed portion of a thin film, and having a vibrating component transmit the dynamic properties of the vibration to the thin film. By combining the above measurement results in calculations, the Young's modulus, the Poisson's ratio, and the density of the thin film can be obtained.

Abstract: This invention relates to a device and method for optical nanoindentation measurement, according to which respective measurement results are obtained by having an indenter tip apply load to a fixed portion of a thin film, having an indenter tip apply load to a non-fixed portion of a thin film, and having a vibrating component transmit the dynamic properties of the vibration to the thin film. By combining the above measurement results in calculations, the Young's modulus, the Poisson's ratio, and the density of the thin film can be obtained.