Abstract: A memory device includes a plurality of memory chips storing and outputting data in response to a control command and an address command, at least one ECC memory chip providing an error check and correction (ECC) function on the data stored and output by the plurality of the memory chips, and a controller, marking a memory chip in which a defective memory cell is detected among the plurality of memory chips, as a defective memory chip, storing data of the defective memory chip in the ECC memory chip, and controlling the defective memory chip to execute a post package repair (PPR).

Abstract: A memory system includes a processor that includes cores and a memory controller, and a first semiconductor memory module that communicates with the memory controller. The cores receive a call to perform a first exception handling in response to detection of a first error when the memory controller reads first data from the first semiconductor memory module. A first monarchy core of the cores performs the first exception handling and the remaining cores of the cores return to remaining operations previously performed.

Abstract: A memory device includes a plurality of memory chips storing and outputting data in response to a control command and an address command, at least one ECC memory chip providing an error check and correction (ECC) function on the data stored and output by the plurality of the memory chips, and a controller, marking a memory chip in which a defective memory cell is detected among the plurality of memory chips, as a defective memory chip, storing data of the defective memory chip in the ECC memory chip, and controlling the defective memory chip to execute a post package repair (PPR).

Abstract: A memory device includes a plurality of memory chips storing and outputting data in response to a control command and an address command, at least one ECC memory chip providing an error check and correction (ECC) function on the data stored and output by the plurality of the memory chips, and a controller, marking a memory chip in which a defective memory cell is detected among the plurality of memory chips, as a defective memory chip, storing data of the defective memory chip in the ECC memory chip, and controlling the defective memory chip to execute a post package repair (PPR).

Abstract: A memory system includes a processor that includes cores and a memory controller, and a first semiconductor memory module that communicates with the memory controller. The cores receive a call to perform a first exception handling in response to detection of a first error when the memory controller reads first data from the first semiconductor memory module. A first monarchy core of the cores performs the first exception handling and the remaining cores of the cores return to remaining operations previously performed.

Abstract: A memory device includes a plurality of memory chips storing and outputting data in response to a control command and an address command, at least one ECC memory chip providing an error check and correction (ECC) function on the data stored and output by the plurality of the memory chips, and a controller, marking a memory chip in which a defective memory cell is detected among the plurality of memory chips, as a defective memory chip, storing data of the defective memory chip in the ECC memory chip, and controlling the defective memory chip to execute a post package repair (PPR).

Abstract: A memory module including a plurality of memory chips each including DQ contact points which are grouped into at least one DQ group corresponding to a correction data width, a serial presence detect (SPD) chip configured to store DQ grouping information about the plurality of memory chips, and additional DQS contact points connected to the at least one DQ group, the additional DQS contact points configured to transmit signals to perform a data correction algorithm based on the correction data width in an error correction mode may be provided.

Abstract: A memory module includes a counter configured to count a number of commands received from a host to generate a counted number and provide the counted value to the host, a memory device configured to receive an operating frequency and an operating voltage from that host that are determined based on the counted number, and a serial presence detect (SPD) configured to store the operating frequency and operating voltage.

Abstract: A memory module includes a counter configured to count a number of commands received from a host to generate a counted number and provide the counted value to the host, a memory device configured to receive an operating frequency and an operating voltage from that host that are determined based on the counted number, and a serial presence detect (SPD) configured to store the operating frequency and operating voltage.

Abstract: A method of optimizing a driving voltage of an electronic device includes; iteratively varying the level of a driving voltage provided to the electronic device and performing an operation of the electronic device with each iteration until the operation fails, and then selecting as an operating level for the driving voltage, a level of the driving voltage for an iteration just prior to an iteration in which the operation fails.