Abstract: A semiconductor device is provided. The semiconductor device includes a first stacked structure including a plurality of first insulating patterns and a plurality of first semiconductor patterns alternately stacked on a substrate, the first stacked structure extending in a first direction parallel to an upper surface of the substrate, a first conductive pattern on one side surface of the first stacked structure, the first conductive pattern extending in a second direction crossing the upper surface of the substrate, and a first ferroelectric layer between the first stacked structure and the first conductive pattern, the first ferroelectric layer extending in the second direction, wherein each of the first semiconductor patterns includes a first impurity region, a first channel region and a second impurity region which are sequentially arranged along the first direction.

Abstract: A display apparatus is provided. The display apparatus includes a display panel, a backlight, a sensor, and a processor configured to drive the backlight unit so as to provide the display panel with light. The processor acquires a current duty for driving the backlight unit based on pixel information on an input image, acquires a gain value of the current duty based on ambient illumination sensed by the sensor and a ratio of a black pixel value included in the input image, and drives the backlight unit by applying the acquired gain value to the current duty.

Abstract: A display apparatus is provided. The display apparatus includes a display panel, a backlight, a sensor, and a processor configured to drive the backlight unit so as to provide the display panel with light. The processor acquires a current duty for driving the backlight unit based on pixel information on an input image, acquires a gain value of the current duty based on ambient illumination sensed by the sensor and a ratio of a black pixel value included in the input image, and drives the backlight unit by applying the acquired gain value to the current duty.

Abstract: A block transform image processing method employs singular value decomposition to reduce noise without affecting texture and edge detail. A nonlinear gain function based on the measured statistics of the singular values for image noise is generated. The image is filtered to produce a detail image and a low pass filtered image. The detail image is divided into blocks and the blocks are transformed to produce singular vectors and arrays of singular values. The nonlinear gain function is applied to the arrays of singular values and an inverse SVD transform is applied to the modified singular values to produce a processed detail image. The processed detail image is combined with the low pass filtered image to produce a processed image having reduced noise.