Patents by Inventor Huibert Blokland
Huibert Blokland has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20220042958Abstract: The invention relates to a capacitive sensing material and a method of manufacturing thereof, a capacitive sensing coating formulation, a capacitive chip, a capacitive sensor, a method for manufacturing a coated chip, a method for analysing the composition of a gaseous mixture, a use of particles comprising titanium oxide and platinum for sensing hydrogen, and a use of capacitive sensing material for detecting a gas leak. The capacitive sensing material comprises composite particles wherein porous titanium dioxide is at least in part coated with platinum particles.Type: ApplicationFiled: February 27, 2020Publication date: February 10, 2022Applicant: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Arjen BOERSMA, Jörgen SWEELSSEN, Huibert BLOKLAND, Renz Jeroen VAN EE
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Patent number: 10073063Abstract: A hollow structure like a pipeline is inspected using an array of ultrasound transmitters located within the hollow structure distributed over different radial directions from a center of the array. Parameters such as ellipticity, defining a shape and/or orientation of an inner surface of a wall of the hollow structure are first determined based on measured delays between transmission of ultrasound pulses from the transmitters to reception of first reflections of those ultrasound pulses. Parameters may be used that define an elliptically shaped cross-section of the inner wall surface for example. Next an ultrasound wavefront composed of joint transmissions from the transmitters along at least a sector of the array is transmitted, using relative time delays between waves transmitted by the respective ones of the transmitters to compensate for estimated differences between travel times from the transmitters to the shape defined by the parameters. Reflections of the joint transmissions are detected.Type: GrantFiled: December 19, 2014Date of Patent: September 11, 2018Assignee: NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNOInventors: Paul Louis Maria Joseph van Neer, Gerrit Blacquiere, Arno Willem Frederik Volker, Huibert Blokland
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Publication number: 20160320346Abstract: A hollow structure like a pipeline is inspected using an array of ultrasound transmitters located within the hollow structure distributed over different radial directions from a center of the array. Parameters such as ellipticity, defining a shape and/or orientation of an inner surface of a wall of the hollow structure are first determined based on measured delays between transmission of ultrasound pulses from the transmitters to reception of first reflections of those ultrasound pulses. Parameters may be used that define an elliptically shaped cross-section of the inner wall surface for example. Next an ultrasound wavefront composed of joint transmissions from the transmitters along at least a sector of the array is transmitted, using relative time delays between waves transmitted by the respective ones of the transmitters to compensate for estimated differences between travel times from the transmitters to the shape defined by the parameters. Reflections of the joint transmissions are detected.Type: ApplicationFiled: December 19, 2014Publication date: November 3, 2016Inventors: Paul Louis Maria Joseph van Neer, Gerrit Blacquiere, Arno Willem Frederik Volker, Huibert Blokland
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Patent number: 9212939Abstract: Fluid flows through a conduit. To measure flow speed the fluid is heated at a heating location in the conduit with a time-dependent heating strength. A speed of sound in fluid flowing in the conduit is measured at a plurality of sensing locations downstream from said heating location. The flow speed of the fluid is determined from a delay with which the time dependence is detected in the sound speeds measured at said sensing locations. In an embodiment a frequency of the variation of heating strength that is used to determine the flow speed is selected automatically dependent on the flow speed and/or other circumstances.Type: GrantFiled: April 2, 2009Date of Patent: December 15, 2015Assignee: Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNOInventors: Arno Willem Frederik Volker, Leon Ferdinand Gerard Geers, Huibert Blokland, Theodoor Peter Martijn Hunter
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Patent number: 8225678Abstract: A fluid flow meter is described that uses thermal tracers to measure flow speed. For fluid flowing through a conduit, the fluid is heated at a heating location in the conduit with a time-dependent heating strength. A speed of sound in fluid flowing in the conduit is measured at multiple sensing locations downstream from said heating location. The flow speed of the fluid is determined from a delay with which the time dependence is detected in the sound speeds measured at the sensing locations. A frequency of the variation of heating strength that is used to determine the flow speed is selected automatically based on the flow speed and/or other circumstances.Type: GrantFiled: November 9, 2007Date of Patent: July 24, 2012Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNOInventors: Arno Willem Frederik Volker, Huibert Blokland, Johannes Fransiscus Maria Velthuis, Joost Conrad Lötters
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Publication number: 20110087447Abstract: Fluid flows through a conduit. To measure flow speed the fluid is heated at a heating location in the conduit with a time-dependent heating strength. A speed of sound in fluid flowing in the conduit is measured at a plurality of sensing locations downstream from said heating location. The flow speed of the fluid is determined from a delay with which the time dependence is detected in the sound speeds measured at said sensing locations. In an embodiment a frequency of the variation of heating strength that is used to determine the flow speed is selected automatically dependent on the flow speed and/or other circumstances.Type: ApplicationFiled: April 2, 2009Publication date: April 14, 2011Inventors: Arno Willem Frederik Volker, Leon Ferdinand Gerard Geers, Huibert Blokland, Theodoor Peter Martijn Hunter
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Publication number: 20100266748Abstract: The invention is directed to a method for preparing a deposition on a substrate and to a method for manufacturing an electronic or optoelectronic device. The method of the invention comprises —providing an anode comprising electrolytically ionisable material and a cathode both in contact with an electrically conductive liquid, comprising anions capable of forming a molecule with the electrolytically ionised material; —electrolytically oxidising the ionisable material under formation of cations that dissolve in the liquid; —evaporating the molecules formed from the cations and the anions from the liquid; and —depositing the molecules on the substrate.Type: ApplicationFiled: October 29, 2008Publication date: October 21, 2010Applicant: NEDERLANDSE ORGANISATIE VOOR TOEGEPASTNATUURWETENSCHAPPELIJKInventors: Petrus Marinus Martinus Cornelus Bressers, Cornelis Petrus Marcus Roelands, Huibert Blokland, Johannes Fransiscus Maria Velthuis
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Patent number: 7751059Abstract: A level sensor for determining a height of a substrate. In one configuration, the level sensor forms part of a lithographic apparatus that includes a projection lens system. The level sensor generates one or more measurement beams and directs the measurement beam to a measurement spot on a substrate having a first reflecting surface, and produces a reflected measurement beam. The level sensor also generates one or more reference beams. A detector detects both the reflected measurement beam and the reference beam, respectively, and produces a measurement signal and a reference signal, respectively, the measurement signal being indicative for the height at the measurement spot. A processor that receives these signals and corrects the measurement signal based on the reference signal.Type: GrantFiled: June 5, 2006Date of Patent: July 6, 2010Assignee: ASML Netherlands B.V.Inventors: Nicolaas Antonius Allegondus Johannes Van Asten, Oana Cristina Balan, Luberthus Ouwehand, Machiel Jacobus Johannes Viguurs, Alexander Charles Franciscus Anna Van Well, Lun Kai Cheng, Huibert Blokland, Elke Van Loenhout, Hans Baltus Bakker
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Publication number: 20100000333Abstract: Fluid flows through a conduit. To measure flow speed the fluid is heated at a heating location in the conduit with a time-dependent heating strength. A speed of sound in fluid flowing in the conduit is measured at a plurality of sensing locations downstream from said heating location. The flow speed of the fluid is determined from a delay with which the time dependence is detected in the sound speeds measured at said sensing locations. In an embodiment a frequency of the variation of heating strength that is used to determine the flow speed is selected automatically dependent on the flow speed and/or other circumstances.Type: ApplicationFiled: November 9, 2007Publication date: January 7, 2010Applicant: Nederlandse Organisatie Voor Toegepast- natuurwetenschappeliijk Onderzoek TNOInventors: Arno Willem Frederik Volker, Huibert Blokland, Johannes Franciscus Maria Velthuis, Joost Conrad Lotters
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Publication number: 20080309915Abstract: The invention relates to a level sensor for determining a height of a substrate. The level sensor generates one or more measurement beam and directs the measurement beam to a measurement spot on the substrate and produces a reflected measurement beam. The level sensor also generates one or more reference beams. A detector detects both the reflected measurement beam and the reference beam, respectively, and produces a measurement signal and a reference signal, respectively, the measurement signal being indicative for the height at the measurement spot. A processor that receives these signals and corrects the measurement signal based on the reference signal. The level sensor has an optical arrangement in a predetermined area close to where the substrate is to be located. The measurement beam and the reference beam propagate along substantially equal optical paths of propagation in the predetermined area.Type: ApplicationFiled: August 8, 2008Publication date: December 18, 2008Applicant: ASML NETHERLANDS B.V.Inventors: Nicolaas Antonius Allegondus Johannes Van Asten, Oana Cristina Balan, Luberthus Ouwehand, Machiel Jacobus Johannes Viguurs, Alexander Charles Franciscus Anna Van Well, Lun Kai Cheng, Huibert Blokland, Elke Van Loenhout, Hans Baltus Bakker
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Patent number: 7411667Abstract: The invention relates to a level sensor for determining a height of a substrate. The level sensor generates one or more measurement beam and directs the measurement beam to a measurement spot on the substrate and produces a reflected measurement beam. The level sensor also generates one or more reference beams. A detector detects both the reflected measurement beam and the reference beam, respectively, and produces a measurement signal and a reference signal, respectively, the measurement signal being indicative for the height at the measurement spot. A processor that receives these signals and corrects the measurement signal based on the reference signal. The level sensor has an optical arrangement in a predetermined area close to where the substrate is to be located. The measurement beam and the reference beam propagate along substantially equal optical paths of propagation in the predetermined area.Type: GrantFiled: October 18, 2005Date of Patent: August 12, 2008Assignee: ASML Netherlands B.V.Inventors: Nicolaas Antonius Allegondus Johannes Van Asten, Oana Cristina Balan, Luberthus Ouwehand, Machiel Jacobus Johannes Viguurs, Alexander Charles Franciscus Anna Van Well, Lun Kai Cheng, Huibert Blokland, Elke Van Loenhout, Hans Baltus Bakker
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Publication number: 20070013915Abstract: A level sensor for determining a height of a substrate. In one configuration, the level sensor forms part of a lithographic apparatus that includes a projection lens system. The level sensor generates one or more measurement beams and directs the measurement beam to a measurement spot on a substrate having a first reflecting surface, and produces a reflected measurement beam. The level sensor also generates one or more reference beams. A detector detects both the reflected measurement beam and the reference beam, respectively, and produces a measurement signal and a reference signal, respectively, the measurement signal being indicative for the height at the measurement spot. A processor that receives these signals and corrects the measurement signal based on the reference signal.Type: ApplicationFiled: June 5, 2006Publication date: January 18, 2007Applicant: ASML Netherlands B.V.Inventors: Nicolaas Antonius Allegondus Van Asten, Oana Balan, Luberthus Ouwehand, Machiel Jacobus Viguurs, Alexander Charles Van Well, Lun Cheng, Huibert Blokland, Elke Loenhout, Hans Bakker
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Publication number: 20060274324Abstract: The invention relates to a level sensor for determining a height of a substrate. The level sensor generates one or more measurement beam and directs the measurement beam to a measurement spot on the substrate and produces a reflected measurement beam. The level sensor also generates one or more reference beams. A detector detects both the reflected measurement beam and the reference beam, respectively, and produces a measurement signal and a reference signal, respectively, the measurement signal being indicative for the height at the measurement spot. A processor that receives these signals and corrects the measurement signal based on the reference signal. The level sensor has an optical arrangement in a predetermined area close to where the substrate is to be located. The measurement beam and the reference beam propagate along substantially equal optical paths of propagation in the predetermined area.Type: ApplicationFiled: October 18, 2005Publication date: December 7, 2006Applicant: ASML Netherlands B.V.Inventors: Nicolaas Antonius Allegondus Van Asten, Oana Balan, Luberthus Ouwehand, Machiel Jacobus Viguurs, Alexander Charles Van Well, Lun Cheng, Huibert Blokland, Elke Van Loenhout, Hans Baltus Bakker