Patents by Inventor Huiling Ren

Huiling Ren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for constructing surface stress distribution cloud map based on critical refraction longitudinal wave detection
    Patent number: 11946908
    Abstract: The present invention discloses a method for constructing a surface stress distribution cloud map based on critical refraction longitudinal wave detection. The method comprises: firstly, meshing a surface of a detected article; secondly, The mean transverse stress on different grid lines and the mean longitudinal stress on different grid lines were obtained by the critical refraction longitudinal wave detection method; next, calculating the equivalent stress of each mesh node according to the mean transverse stress on different mesh transverse lines and the mean longitudinal stress on different mesh longitudinal lines on the surface of the detected article; and finally, drawing a stress distribution cloud map of the surface of the detected article according to the equivalent stress. The present invention can obtain the stress situations at different points on the surface of the detected article.
    Type: Grant
    Filed: September 24, 2023
    Date of Patent: April 2, 2024
    Assignees: Beijing Precision Machinery & Engineering Research Co., Ltd., Beijing University Of Technology
    Inventors: Yuhong Dai, Nana Niu, Zuguang Huang, Junyan Xing, Xiaofeng Zhu, Huiling Ren, Heqiang Liu, Dequan Wang, Yaru Hou, Xiaoqin Hao
  • METHOD FOR CONSTRUCTING SURFACE STRESS DISTRIBUTION CLOUD MAP BASED ON CRITICAL REFRACTION LONGITUDINAL WAVE DETECTION
    Publication number: 20240011948
    Abstract: The present invention discloses a method for constructing a surface stress distribution cloud map based on critical refraction longitudinal wave detection. The method comprises: firstly, meshing a surface of a detected article; secondly, The mean transverse stress on different grid lines and the mean longitudinal stress on different grid lines were obtained by the critical refraction longitudinal wave detection method; next, calculating the equivalent stress of each mesh node according to the mean transverse stress on different mesh transverse lines and the mean longitudinal stress on different mesh longitudinal lines on the surface of the detected article; and finally, drawing a stress distribution cloud map of the surface of the detected article according to the equivalent stress. The present invention can obtain the stress situations at different points on the surface of the detected article.
    Type: Application
    Filed: September 24, 2023
    Publication date: January 11, 2024
    Inventors: Yuhong Dai, Nana Niu, Zuguang Huang, Junyan Xing, Xiaofeng Zhu, Huiling Ren, Heqiang Liu, Dequan Wang, Yaru Hou, Xiaoqin Hao