Abstract: Provided is a multi-valued dynamic random access memory (DRAM) cell using a single electron transistor (SET). The multi-valued DRAM cell using the SET applies different refresh signals to a load current transistor for controlling current supply to the SET and a voltage control transistor for controlling a terminal voltage of the SET and refreshes a data value stored in the SET by a predetermined period to reduce standby current and stably supply a voltage low enough to satisfy a coulomb-blockade condition to the terminal of the SET.

Abstract: Provided herein is an MV DRAM device for storing multiple value levels using an SET device. The device includes one or more word lines; one or more bitlines; a DRAM cell connected to intersections of the word lines and the bitlines; a current source transistor having a source connected to a power supply voltage and a gate and a drain connected to the bitlines; an SET (single electron transistor) device having a gate connected to the bitlines and a source connected to the ground voltage; and a transistor connected between the bitlines and the drain of the SET device, where the gate of the transistor is connected to the ground voltage.

Abstract: Provided herein is an MV DRAM device capable of storing multiple value levels using an SET device. The device includes one or more word lines; one or more bitlines; a DRAM cell connected to intersections of the word lines and the bitlines; a current source transistor having a source connected to a power supply voltage and a gate and a drain connected to the bitlines; an SET (single electron transistor) device having a gate connected to the bitlines and a source connected to the ground voltage; and a transistor connected between the bitlines and the drain of the SET device, wherein the gate of the transistor is connected to the ground voltage. According to the MV DRAM device of the present invention, since two or more multiple value data are stored in a cell, it is possible to increase the storage density of the device.

Abstract: Provided is a multi-valued dynamic random access memory (DRAM) cell using a single electron transistor (SET). The multi-valued DRAM cell using the SET applies different refresh signals to a load current transistor for controlling current supply to the SET and a voltage control transistor for controlling a terminal voltage of the SET and refreshes a data value stored in the SET by a predetermined period to reduce standby current and stably supply a voltage low enough to satisfy a coulomb-blockade condition to the terminal of the SET.

Abstract: Provided herein is a serial flash memory device and precharging method thereof in which a single local bit-line data is sensed in synchronization with a clock. The method includes precharging two or more local bit-lines in synchronization with a first clock; and disprecharging one of the two local bit-lines in synchronization with a second clock and sensing and amplifying data of the other local bit-line. Accordingly, two precharged local bit-lines are not adjacent to each other, thereby eliminating a coupling noise effect. In addition, the time for performing the precharging operation and the sensing operation is easily secured, compared to the prior precharging method in which corresponding local bit-lines are precharged at every clock.

Abstract: Provided herein is a serial flash memory device and precharging method thereof in which a single local bit-line data is sensed in synchronization with a clock. The method includes precharging two or more local bit-lines in synchronization with a first clock; and disprecharging one of the two local bit-lines in synchronization with a second clock and sensing and amplifying data of the other local bit-line. Accordingly, two precharged local bit-lines are not adjacent to each other, thereby eliminating a coupling noise effect. In addition, the time for performing the precharging operation and the sensing operation is easily secured, compared to the prior precharging method in which corresponding local bit-lines are precharged at every clock.

Abstract: A reference voltage generating circuit of a non-volatile ferroelectric memory device includes a temperature compensating control circuit that increases and outputs a level of a signal to a reference capacitor node according to an increase in temperature when a reference control signal is at a high level, a plurality of ferroelectric capacitors connected in parallel, each of first electrodes of the plurality of ferroelectric capacitors are commonly connected to a ground voltage terminal and each of second electrodes of the plurality of ferroelectric capacitors are commonly connected to the reference capacitor node, and a plurality of switching blocks controlled by a reference wordline signal, each having drain terminals commonly connected to the reference capacitor node, source terminals connected to a corresponding bitline.

Abstract: A nonvolatile ferroelectric memory device includes a top cell array block having a first plurality of unit cells, each with a pair of first and second top split wordlines, a bottom cell array block provided with a second plurality of unit cells, each having a pair of first and second bottom split wordlines to correspond to the pair of first and second top split wordlines, a top split wordline driver controlling an output signal transmitted to the first and second top split wordlines of the top cell array block, a bottom split wordline driver controlling an output signal transmitted to the first and second bottom split wordlines of the bottom cell array block, a split wordline driver controller outputting first and second split wordline control signals, and a sensing amplifier arranged for each bitline between the top cell array block and the bottom cell array block.

Abstract: The present invention discloses a magnetic random access memory comprising MRAM cell groups connected in series in forms of an NAND. The MRAM cell groups comprise magnetic tunnel junctions between word lines and P-N diodes, and memory cells for reading and writing data. In the present invention, the cell size can be reduced by comprising MRAM cell arrays wherein one or more MRAM cells are connected in series in forms of an NAND.

Abstract: A nonvolatile ferroelectric memory device and a method for driving the same are disclosed, the device and method devised to stabilize the operation processes and reduce the operation time. The nonvolatile ferroelectric memory device includes a cell array block having a plurality of unit cells being controlled by plate lines and wordlines, a plate line driver being positioned on one side of the cell array block to apply a driving signal to the plate lines, a wordline driver being positioned on the other side of the cell array block to apply a driving signal to the wordlines, a plurality of sub bitlines and main bitlines being arranged on the cell array block in the same direction, and switching control blocks controlling signals applied to the sub bitlines and main bitlines.

Abstract: A nonvolatile ferroelectric memory device includes a plurality of top array blocks disposed along a first direction, each having a plurality of top sub-cell array blocks disposed along a second direction perpendicular to the first direction, each of the top sub-cell array blocks include a first plurality of unit cells, a plurality of bottom array blocks disposed along the first direction below the plurality of top array blocks, each having a plurality of bottom sub-cell array blocks disposed along the second direction, each of the bottom sub-cell array blocks include a second plurality of unit cells, a plurality of sub-bit lines extending along the second direction and disposed at equal first intervals along the first direction, each sub-bit line connected to at least a first end of one of the first and second pluralities of unit cells, and a plurality of main bit lines extending along the second direction and disposed at the equal first intervals along a third direction perpendicular to both the first and se

Abstract: A fail repair circuit of a nonvolatile ferroelectric memory device and a method for repairing the same are disclosed, in which a redundancy time can be reduced and a redundancy algorithm can be changed or added at any time.

Abstract: A ferroelectric memory device includes a plurality of wordlines and a plurality of plate lines, the wordlines and the plate lines being alternately formed at regular intervals in one direction; a plurality of sub bitlines and a plurality of main bitlines, the sub bitlines and the main bitlines alternately formed at regular intervals to cross the wordlines and the plate lines; a plurality of sub cell arrays connected with the wordlines, the sub bitlines and the plate lines, having cells in directions defined by a plurality of rows and columns, the cells in the direction of the rows being arranged every two columns and the cells in the direction of the columns being arranged every two rows, respectively; and switching elements each operating between one of the sub bitlines and one of the main bitlines by an externally applied bitline switch signal of a constant pulse type to selectively connect the sub bitline with the main bitline.

Abstract: A nonvolatile ferroelectric memory includes a top cell array block and a bottom cell array block, each array block having sub cell array blocks, each sub cell array block having a plurality of unit cells; a plurality of main bitlines arranged in one direction in correspondence to a column unit of the sub cell array blocks; a plurality of sub bitlines each connected to one terminal of one of the plurality of unit cells arranged in a same direction as the one direction of the main bitlines; a sense amplifier block having sense amplifiers between the top cell array block and the bottom cell array block, each sense amplifier for amplifying a signal from the main bitline; sub bitline first switch signal application lines and sub bitline second switch signal application lines for controlling connection of the sub bitlines and the main bitlines, sub bitline pull up signal application lines for controlling pull up of the sub bitlines by a self boost operation, and sub bitline pull down signal application lines for se

Abstract: Disclosed is an apparatus and method for driving a ferroelectric memory that can secure an enough read/write cycle time of a corresponding address during a chip is driven.

Abstract: A column repair circuit in a non-volatile ferroelectric memory having main columns and redundancy columns includes a data input/output buffer part for data input/output between the non-volatile ferroelectric memory and an external circuit, a failed column coding part for controlling the main columns and the redundancy columns and connected in response to a failed column address signal to one of main input/output lines in the input/output buffer part and redundancy input/output lines, a repair column adjusting circuit part connected to the failed column coding part for providing a redundancy mode control signal, a data bus amplifying part for amplifying data between the main input/output lines and the main columns to control read/write operation, and a redundancy data bus amplifying part for amplifying data between the redundancy input/output lines and the redundancy columns in response to the redundancy mode control signal.

Abstract: A fail repair circuit of a nonvolatile ferroelectric memory device and a method for repairing the same are disclosed, in which a redundancy time can be reduced and a redundancy algorithm can be changed or added at any time.

Abstract: A nonvolatile ferroelectric memory device includes a first cell array block and a second cell array block, each divided into an upper part and a lower part; sensing amplifiers arranged one by one on multiple bit lines at a middle portion between the first cell array block and the second cell array block; a data I/O encoder connected to end portions of the multiple bit lines for outputting multi-bit signals by encoding outputs of the sensing amplifiers; and a first reference cell array block and a second reference cell array block arranged between the first cell array block and the data I/O encoder and between the second cell array block and the data I/O encoder.

Abstract: A circuit for testing a ferroelectric capacitor in a FRAM includes: a test pulse signal generating part; a digital test pulse providing part, responsive to the test pulse signal; an n-bit counter, responsive to the digital test pulse signal as a clock signal; a measuring control signal providing part; a write pulse bar signal generating part; an input drive control part for receiving a reference voltage signal, a voltage signal at the first electrode of the ferroelectric capacitor, the measuring control signal, and the write pulse bar signal, and applying a driving voltage to the second electrode of the ferroelectric capacitor in response to the test pulse signal, and a measured result forwarding part for receiving the reference voltage signal and the voltage signal from the first electrode, and amplifying and forwarding a voltage variation between the electrodes of the ferroelectric capacitor.

Abstract: A ferroelectric memory device includes a cell array block having a plurality of sub-cell array blocks regularly arranged in columns and rows, each sub-cell array block includes a plurality of unit cells, a plurality of main bitlines disposed along a first direction corresponding to the sub-cell array blocks in column units, a plurality of sub-bitlines disposed along the first direction in a one-to-one correspondence to the sub-cell array blocks, a plurality of pairs of sub-bitline pull down signal application lines and sub-bitline enable switch signal application lines disposed along a second direction perpendicular to the first direction, each pair corresponding to the sub-cell array block for applying a sub-bitline enable switch signal and a sub-bitline pull down signal, and a plurality of switching control blocks, each corresponding to the sub-cell array block for one of enabling the sub-bitlines selectively in response to the sub-bitline enable switch signal and pulling down the sub-bitlines in response t