Patents by Inventor HUNG-CHIH SUNG

HUNG-CHIH SUNG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrical testing machine
    Patent number: 9459279
    Abstract: An electrical testing machine includes a base having two parallel first rails, a platform provided on the base, a probe holder provided on the base and having a plurality of placement locations, a support provided between the first rails and having a second rail thereon, a test arm provided on the second rail and above the platform, a receiving seat provided on the test arm, and a plurality of probe sets, wherein one of the probe sets is engaged on the receiving seat, while the others are respectively provided on the placement locations. The support is movable relative to the base and the platform. The test arm is movable along with the support, and is also movable relative to the support. The receiving seat is movable or rotatable relative to the test arm. The probe set engaged on the receiving seat is movable along with the receiving seat.
    Type: Grant
    Filed: December 1, 2014
    Date of Patent: October 4, 2016
    Assignee: MPI CORPORATION
    Inventors: Wei-Cheng Ku, Shao-Wei Lu, Hung-Chih Sung, Chun-Nan Chen
  • ELECTRICAL TESTING MACHINE
    Publication number: 20150204908
    Abstract: An electrical testing machine includes a base having two parallel first rails, a platform provided on the base, a probe holder provided on the base and having a plurality of placement locations, a support provided between the first rails and having a second rail thereon, a test arm provided on the second rail and above the platform, a receiving seat provided on the test arm, and a plurality of probe sets, wherein one of the probe sets is engaged on the receiving seat, while the others are respectively provided on the placement locations. The support is movable relative to the base and the platform. The test arm is movable along with the support, and is also movable relative to the support. The receiving seat is movable or rotatable relative to the test arm. The probe set engaged on the receiving seat is movable along with the receiving seat.
    Type: Application
    Filed: December 1, 2014
    Publication date: July 23, 2015
    Applicant: MPI CORPORATION
    Inventors: WEI-CHENG KU, SHAO-WEI LU, HUNG-CHIH SUNG, CHUN-NAN CHEN