Patents by Inventor Hung-Ju Wu

Hung-Ju Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11946945
    Abstract: A sample analyzing method and a sample preparing method are provided. The sample analyzing method includes a sample preparing step, a placing step, and an analyzing step. The sample preparing step includes an obtaining step implemented by obtaining an identification information; and a marking and placing step implemented by placing a sample carrying component having a sample disposed thereon into a marking equipment, allowing the marking equipment to utilize the identification information to form an identification structure on the sample carrying component, and placing the sample carrying component into one of the accommodating slots according to the identification information. The placing step is implemented by taking out the sample carrying component from one of the accommodating slots and placing the sample carrying component into an electron microscope equipment. The analyzing step is implemented by utilizing the electron microscope equipment to photograph the sample to generate an analyzation image.
    Type: Grant
    Filed: July 29, 2021
    Date of Patent: April 2, 2024
    Assignee: MATERIALS ANALYSIS TECHNOLOGY INC.
    Inventors: Keng-Chieh Chu, Tsung-Ju Chan, Chun-Wei Wu, Hung-Jen Chen
  • Patent number: D892352
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: August 4, 2020
    Assignee: Delta Electronics, Inc.
    Inventors: Song-Bin Huang, Ching-Chen Liao, Yu-Kai Kao, Chang-Yen Wu, Wei-Yu Chung, Hung-Ju Wu