Patents by Inventor Hung Phi
Hung Phi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12265212Abstract: A three-dimensional (3D) microscope includes various insertable components that facilitate multiple imaging and measurement capabilities. These capabilities include Nomarski imaging, polarized light imaging, quantitative differential interference contrast (q-DIC) imaging, motorized polarized light imaging, phase-shifting interferometry (PSI), and vertical-scanning interferometry (VSI).Type: GrantFiled: November 28, 2022Date of Patent: April 1, 2025Assignee: KLA-Tencor CorporationInventors: James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou
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Publication number: 20250093274Abstract: A method includes enabling a first radiating source configured to output a first beam, enabling a second radiating source configured to output a second beam, directing the first beam to irradiate a sample at an angle of incidence of ten degrees of Brewster's angle or less, directing the second beam to irradiate a sample at an angle of incidence of ten degrees or less (the first beam and the second beam only pass through a single scan lens before irradiating the sample), measuring scattered radiation data resulting from the irradiation of the sample by the second beam, measuring reflected radiation resulting from irradiation of the sample by the first beam, and determining the presence of a defect based at least in part on one of the measurements. The radiating sources may be enabled in an alternating fashion so to improve resulting measurement performance.Type: ApplicationFiled: November 27, 2023Publication date: March 20, 2025Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Publication number: 20240428045Abstract: A system captures and utilizes expert knowledge in artificial intelligence. The system includes a knowledge capture module for extracting expert knowledge from subject matter experts in a conversational format and a knowledge management module for cataloging and summarizing the extracted knowledge. The system also includes a digital subject matter expert (dSME) module for ingesting the cataloged knowledge and using it to guide users in building AI models. A chatbot interacts with a user and selects the appropriate dSME module that is relevant to the user request. The system attempts to answer the user request based on the dSME module. If the dSME module lacks knowledge to solve the problem, the system uses a set of tools, for example, internet based search engine to solve the problem.Type: ApplicationFiled: June 25, 2024Publication date: December 26, 2024Inventors: Christopher Nguyen, Roshan Devan Nanu, Hong An Phan, Tri Cao Le, Thao Phuong Nguyen, Loc Tan Nguyen, Tuan Hoang Pham, Hung Phi Vo, Phuoc Le Trong Bui, Zooey Nhu-Quynh Nguyen, Sang Xuan Dinh, Nam Hoai Vuong
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Patent number: 12147033Abstract: An optical scanning system includes a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scan lens is located approximately one focal length of the de-scan lens from a sample irradiation location, a focusing lens that is configured to output a focused light beam, a first non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam, a second non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam that is reflected by the first non-polarizing beam splitter, and a detector that is located at approximately one focal length of the focusing lens from the focusing lens, the detector is configured to be irradiated by at least a portion of the focused light beam that is reflected by the second non-polarizing beam splitter.Type: GrantFiled: March 3, 2022Date of Patent: November 19, 2024Assignee: Lumina Instruments Inc.Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Patent number: 12146830Abstract: An optical scanning system including a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scanned light beam is created by focusing light reflected from the sample and the de-scan lens is located approximately one focal length of the de-scan lens from an irradiation location where the light beam irradiates the sample, a focusing lens that is configured to output a focused light beam, a collimating lens that is configured to output a collimated light beam, a polarizing beam splitter that is configured to be irradiated by the collimated light beam, and a detector that is configured to be irradiated by at least a portion of the collimated light beam that is not reflected by the polarizing beam splitter.Type: GrantFiled: March 3, 2022Date of Patent: November 19, 2024Assignee: Lumina Instruments Inc.Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Patent number: 12146732Abstract: An optical scanning system includes a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scan lens is located approximately one focal length of the de-scan lens from an sample irradiation location, a focusing lens that is configured to output a focused light beam, a first non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam, a second non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam that is reflected by the first non-polarizing beam splitter, and a detector that is located at approximately one focal length of the focusing lens from the focusing lens, the detector is configured to be irradiated by at least a portion of the focused light beam that is not reflected by the second non-polarizing beam splitter.Type: GrantFiled: March 3, 2022Date of Patent: November 19, 2024Assignee: Lumina Instruments Inc.Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Patent number: 12130243Abstract: An angle independent optical surface inspector capable of generating a light beam, directing the light beam to a sample, and de-scanning a reflected light beam that is reflected from the sample, thereby generating a first de-scanned light beam. The de-scanning is performed at approximately one focal length of a de-scanning lens from an irradiation location where the light beam irradiates the sample. The optical inspector also capable of focusing the first de-scanned light beam, thereby generating a focused light beam, and measuring the location of the focused light beam. The measuring of the location is performed at approximately one focal length of a focusing lens from the focusing lens. The incident angle of the light beam is within ten degrees of Brewster's angle. The focusing is performed by an achromatic lens.Type: GrantFiled: March 3, 2022Date of Patent: October 29, 2024Assignee: Lumina Instruments Inc.Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Publication number: 20240174475Abstract: A first operation restriction portion forms a first step between the first operation restriction portion and a first operation portion. A second operation restriction portion forms a second step between the second operation restriction portion and a second operation portion. A first locking portion releases locking of a locked portion when a first push of pushing the first operation portion or a second push of pushing the second operation portion is performed. When the sheet stopper is rotated in response to the first push, a second locking portion stops the sheet stopper in a first upright state. When the sheet stopper is rotated in response to the second push, the second locking portion allows the sheet stopper to rotate beyond the first upright state. A third locking portion stops the sheet stopper in a second upright state.Type: ApplicationFiled: November 22, 2023Publication date: May 30, 2024Inventor: Hung Phi Le
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Patent number: 11988615Abstract: An optical scanning system including a radiating source that outputs a light beam, a time varying beam reflector that reflects the light beam through a scan lens towards a transparent sample at an incident angle of plus or minus ten degrees from Brewster's angle, a focusing lens configured to be irradiated by light scattered from the transparent sample, and a detector that is irradiated by the light scattered from the transparent sample. The detector outputs a signal that indicates an intensity of light measured by the detector. None of the light scattered from the transparent sample is blocked. The light scattered from the transparent sample is scattered from the top surface of the transparent sample, the bottom surface of the transparent sample, or any location in between the top surface of the transparent sample and the bottom surface of the transparent sample.Type: GrantFiled: January 16, 2022Date of Patent: May 21, 2024Assignee: Lumina Instruments Inc.Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Publication number: 20230421709Abstract: A supported portion of a cover member is rotatably supported by a main support portion of a main body, and is slidable with respect to the main support portion along an extending direction of the cover member. A first joint portion of a link member is rotatably supported by a joint support portion. A second joint portion of the link member is engaged with a joint guide portion slidably along the extending direction. When the cover member is in an open position, a cover engagement portion engages with a main body engagement portion, and the second joint portion engages with a guide base end of the joint guide portion. When the cover member is in the open position, a moment load of the cover member around the second joint portion acts as a force for holding the engagement between the cover engagement portion and the main body engagement portion.Type: ApplicationFiled: June 27, 2023Publication date: December 28, 2023Inventor: HUNG PHI LE
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Patent number: 11852592Abstract: An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanning system causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.Type: GrantFiled: April 27, 2023Date of Patent: December 26, 2023Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Patent number: 11849089Abstract: A supported portion of a cover member is rotatably supported by a main support portion of a main body, and is slidable with respect to the main support portion along an extending direction of the cover member. A first joint portion of a link member is rotatably supported by a joint support portion. A second joint portion of the link member is engaged with a joint guide portion slidably along the extending direction. When the cover member is in an open position, a cover engagement portion engages with a main body engagement portion, and the second joint portion engages with a guide base end of the joint guide portion. When the cover member is in the open position, a moment load of the cover member around the second joint portion acts as a force for holding the engagement between the cover engagement portion and the main body engagement portion.Type: GrantFiled: June 27, 2023Date of Patent: December 19, 2023Assignee: KYOCERA Document Solutions Inc.Inventor: Hung Phi Le
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Publication number: 20230341332Abstract: An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanning system causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.Type: ApplicationFiled: April 27, 2023Publication date: October 26, 2023Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Patent number: 11733173Abstract: An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanner causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.Type: GrantFiled: January 2, 2023Date of Patent: August 22, 2023Assignee: Lumina Instruments Inc.Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Publication number: 20230087619Abstract: A three-dimensional (3D) microscope includes various insertable components that facilitate multiple imaging and measurement capabilities. These capabilities include Nomarski imaging, polarized light imaging, quantitative differential interference contrast (q-DIC) imaging, motorized polarized light imaging, phase-shifting interferometry (PSI), and vertical-scanning interferometry (VSI).Type: ApplicationFiled: November 28, 2022Publication date: March 23, 2023Inventors: James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou
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Publication number: 20230062714Abstract: A method for generating a user profile based on a comparison to peer group data, the user being a member of an institution, the method comprising the steps of: obtaining user profile data pertaining to a user of a network service of the institution; accessing group profile data associated with the user; comparing the user profile data to the group profile data to generate comparative data; generating a user profile for presentation on a user interface, the user profile including the comparative data; sending the user profile to the user; receiving a request from the user for a product of institution; and updating the user profile to include information pertaining to the product.Type: ApplicationFiled: August 18, 2022Publication date: March 2, 2023Inventors: Obakemi Rotimi-Fadipe, Vibhav Dindyal, Hung Phi Phillip Truong, Wei Liu, Hannah McIsaac, Victor CHENG, Timothy Dean McGaugh
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Patent number: 11536940Abstract: A three-dimensional (3D) microscope includes various insertable components that facilitate multiple imaging and measurement capabilities. These capabilities include Nomarski imaging, polarized light imaging, quantitative differential interference contrast (q-DIC) imaging, motorized polarized light imaging, phase-shifting interferometry (PSI), and vertical-scanning interferometry (VSI).Type: GrantFiled: December 2, 2020Date of Patent: December 27, 2022Assignee: KLA-Tencor CorporationInventors: James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou
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Publication number: 20220269071Abstract: An optical scanning system includes a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scan lens is located approximately one focal length of the de-scan lens from a sample irradiation location, a focusing lens that is configured to output a focused light beam, a first non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam, a second non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam that is reflected by the first non-polarizing beam splitter, and a detector that is located at approximately one focal length of the focusing lens from the focusing lens, the detector is configured to be irradiated by at least a portion of the focused light beam that is reflected by the second non-polarizing beam splitter.Type: ApplicationFiled: March 3, 2022Publication date: August 25, 2022Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Publication number: 20220187057Abstract: An optical scanning system includes a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scan lens is located approximately one focal length of the de-scan lens from an sample irradiation location, a focusing lens that is configured to output a focused light beam, a first non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam, a second non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam that is reflected by the first non-polarizing beam splitter, and a detector that is located at approximately one focal length of the focusing lens from the focusing lens, the detector is configured to be irradiated by at least a portion of the focused light beam that is not reflected by the second non-polarizing beam splitter.Type: ApplicationFiled: March 3, 2022Publication date: June 16, 2022Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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Publication number: 20220187204Abstract: An optical scanning system including a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scanned light beam is created by focusing light reflected from the sample and the de-scan lens is located approximately one focal length of the de-scan lens from an irradiation location where the light beam irradiates the sample, a focusing lens that is configured to output a focused light beam, a collimating lens that is configured to output a collimated light beam, a polarizing beam splitter that is configured to be irradiated by the collimated light beam, and a detector that is configured to be irradiated by at least a portion of the collimated light beam that is not reflected by the polarizing beam splitter.Type: ApplicationFiled: March 3, 2022Publication date: June 16, 2022Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam