Abstract: A bare circuit board is provided, in which the bare circuit board includes a substrate, an antenna, a chip pad, a ground pattern and a trace. The substrate includes a surface. The antenna and the chip pad are formed on the substrate. The ground pattern is formed on the surface. The trace is formed on the surface and isn’t connected to the ground pattern. A measuring gap is formed between the trace and an edge of the ground pattern, and the trace includes a first end and a second end. The first end is electrically connected to the chip pad, whereas the second end is electrically connected to the antenna. The bare circuit board is adapted to transmit a signal. The width of the measuring gap is smaller than a quarter of an equivalent wavelength of the signal.

Abstract: A composite product testing system including a main management system, a test equipment and a burn-in apparatus is disclosed. The test equipment and the burn-in apparatus are both arranged in a burn-in chamber of the testing system. First, multiple tested products are respectively inserted in multiple gauges of the burn-in chamber, and a burn-in procedure is activated for providing an aging environment. The main management system controls one of the gauges to connect with the test equipment for the test equipment to perform testing on the tested product upon the connected gauge. After the testing is completed, the main management system then controls the gauge to disconnect from the test equipment and re-connect with the burn-in apparatus, so as to monitor the tested product upon the gauge during the burn-in procedure.

Abstract: A composite product testing system including a main management system, a test equipment and a burn-in apparatus is disclosed. The test equipment and the burn-in apparatus are both arranged in a burn-in chamber of the testing system. First, multiple tested products are respectively inserted in multiple gauges of the burn-in chamber, and a burn-in procedure is activated for providing an aging environment. The main management system controls one of the gauges to connect with the test equipment for the test equipment to perform testing on the tested product upon the connected gauge. After the testing is completed, the main management system then controls the gauge to disconnect from the test equipment and re-connect with the burn-in apparatus, so as to monitor the tested product upon the gauge during the burn-in procedure.

Abstract: A detachable inner shield suitable for an isolation bushing of an ion implanter is provided. The inner shield is mounted on an inside of the isolation bushing and completely fitting the inside of the isolation bushing.