Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.

Abstract: A magnetic capacitor element is provided. The magnetic capacitor element includes a first electrode, a second electrode, a first dielectric layer, a second dielectric layer, a magnetic layer and an oxide layer. The second electrode is disposed opposite to the first electrode. The first dielectric layer is disposed between the first electrode and the second electrode. The second dielectric layer is disposed between the first dielectric layer and the second electrode. The magnetic layer is disposed between the second electrode and the second dielectric layer. The oxide layer is disposed between the second dielectric layer and the magnetic layer.

Abstract: A magnetic capacitor element is provided. The magnetic capacitor element includes a first electrode, a second electrode, a first dielectric layer, a second dielectric layer, a magnetic layer and an oxide layer. The second electrode is disposed opposite to the first electrode. The first dielectric layer is disposed between the first electrode and the second electrode. The second dielectric layer is disposed between the first dielectric layer and the second electrode. The magnetic layer is disposed between the second electrode and the second dielectric layer. The oxide layer is disposed between the second dielectric layer and the magnetic layer.

Abstract: The present disclosure provides a magnetic capacitor structure including a first electrode, a second electrode opposite to the first electrode, a dielectric layer disposed between the first electrode and the second electrode, a first magnetic layer disposed between the first electrode and the dielectric layer, a second magnetic layer disposed between the second electrode and the dielectric layer, a first oxide layer disposed between the first electrode and the first magnetic layer, and a second oxide layer disposed between the second magnetic layer and the dielectric layer.

Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.

Abstract: A measurement system having a light source, a holding device, and a measurement device. The light source includes a plurality of light emitting diodes (LEDs) configured to generate light beams with different wavelengths, and the emission spectrum of the light source complies with a predetermined standard. The holding device is configured to hold an object under test. The measurement device is configured to measure the electrical properties of the object under test after the object under test is illuminated by the light source.

Abstract: The present disclosure provides a magnetic capacitor structure including a first electrode, a second electrode opposite to the first electrode, a dielectric layer disposed between the first electrode and the second electrode, a first magnetic layer disposed between the first electrode and the dielectric layer, a second magnetic layer disposed between the second electrode and the dielectric layer, a first oxide layer disposed between the first electrode and the first magnetic layer, and a second oxide layer disposed between the second magnetic layer and the dielectric layer.

Abstract: A material aging test apparatus and method thereof are provided. The aging apparatus includes a pulsed laser, a beam expansion assembly, a platform, and a spectrum analyzer. The pulsed laser is used for transmitting a first beam. The beam expansion assembly is used for converting the first beam into a second beam and projecting the second beam onto an object. The platform is used for carrying the object. The spectrum analyzer is used for measuring the spectral response which is generated from the object by the projection of the second beam.

Abstract: A solar simulator including a light source and a light conduit array is provided. The light source is used for emitting a beam of ray radiation. The light conduit array includes a plurality of light conduits closely adjacent to one another. Each of the light conduits has an inner reflecting surface used for reflecting the ray radiation, a light input side, and a light output side opposite to the light input side. The ray radiation enters the light conduits through the light input side and emitting from the light output side.

Abstract: An aging apparatus including a pulse laser, a beam expansion assembly, and a platform configured to carry an object is provided. The pulse laser transmits a first beam to the beam expansion assembly. The beam expansion assembly expands the first beam to a second beam and projects the second beam onto the object.

Abstract: An aging apparatus including a pulse laser, a beam expansion assembly, and a platform configured to carry an object is provided. The pulse laser transmits a first beam to the beam expansion assembly. The beam expansion assembly expands the first beam to a second beam and projects the second beam onto the object.

Abstract: A material aging test apparatus and method thereof are provided. The aging apparatus includes a pulsed laser, a beam expansion assembly, a platform, and a spectrum analyzer. The pulsed laser is used for transmitting a first beam. The beam expansion assembly is used for converting the first beam into a second beam and projecting the second beam onto an object. The platform is used for carrying the object. The spectrum analyzer is used for measuring the spectral response which is generated from the object by the projection of the second beam.

Abstract: In one exemplary embodiment, an electrical characteristic measuring apparatus of solar cell comprises a resilient metal attached to a bus bar of a solar cell and a conducting device located at one end of the resilient metal. The resilient metal has an open via, and the conducting device contacts with the bus bar through the open via. The electrical characteristic measuring apparatus is attached to the bus bar located at a front plane of solar cell. The resilient metal and the conducting device, respectively, connect electrically to a testing device contacted to electrode located at the back plane of solar cell. Thus the resilient metal, the testing device, and the electrode of the back plane form a current measuring loop, and the conducting device, the testing device, and the electrode of the back plane form a voltage measuring loop.

Abstract: The method for forming the optimal characteristic curve of a solar cell comprises the steps of: providing a first acceptable error; and determining a current-voltage polynomial regression equation, whose square root of the residual sum of square is less than the first acceptable error for a set of solar cell measured data. The order of the current-voltage polynomial regression equation is gradually increased until the square root of the residual sum of square of the current-voltage polynomial regression equation is less than the first acceptable error.

Abstract: A solar simulator including a light source and a light conduit array is provided. The light source is used for emitting a beam of ray radiation. The light conduit array includes a plurality of light conduits closely adjacent to one another. Each of the light conduits has an inner reflecting surface used for reflecting the ray radiation, a light input side, and a light output side opposite to the light input side. The ray radiation enters the light conduits through the light input side and emitting from the light output side.

Abstract: A measurement system having a light source, a holding device, and a measurement device. The light source includes a plurality of light emitting diodes (LEDs) configured to generate light beams with different wavelengths, and the emission spectrum of the light source complies with a predetermined standard. The holding device is configured to hold an object under test. The measurement device is configured to measure the electrical properties of the object under test after the object under test is illuminated by the light source.

Abstract: The method for forming the optimal characteristic curve of a solar cell comprises the steps of: providing a first acceptable error; and determining a current-voltage polynomial regression equation, whose square root of the residual sum of square is less than the first acceptable error for a set of solar cell measured data. The order of the current-voltage polynomial regression equation is gradually increased until the square root of the residual sum of square of the current-voltage polynomial regression equation is less than the first acceptable error.