Abstract: The present invention discloses an optical detection apparatus for defining a detection surface on a carrier unit for a wafer in a semiconductor manufacturing process so as to obtain a corresponding detection image, wherein a vertical movement path for another device to move is defined above the carrier unit. The optical detection apparatus includes a support, and an imaging device disposed on the support and configured to be non-interfering with the movement path. The imaging device includes a lens group, an image capturing portion and a moving base. With the moving base, the photosensitive element of the image capturing portion is allowed to move horizontally relative to the lens group, and the imaging position can be adjusted, preventing image deformation or a reduced resolution easily caused by capturing at an oblique angle. Thus, the optical detection apparatus resolves complications of additionally mounting an optical detection apparatus in an optical detection environment within a narrow space.

Abstract: A pair of pliers has a driving handle, a fixed handle, a block plate, a U-shaped spring, a first torsion spring, and a second torsion spring. The driving handle couples with the fixed handle pivotally. The first torsion spring and the second torsion spring are connected to the driving handle and the fixed handle. The U-shaped spring is connected to the driving handle and the fixed handle.