Abstract: Methods and systems for thermal management of hardware resources that may be used to provide computer implemented services are disclosed. The disclosed thermal management method and systems may improve the likelihood of data processing systems providing desired computer implemented services by improving the thermal management of the hardware resources without impairment of storage devices. To improve the likelihood of the computer implemented services being provided, the systems may proactively identify whether storage devices subject to impairment due to dynamic motion are present. If such storage devices are present, then the system may automatically take action to reduce the likelihood of the storage devices being subject to dynamic motion sufficient to impair their operation.

Abstract: A vacuum battery structural assembly and a vacuum multi-cell battery module composed thereof are provided and include a first repeating unit including a first frame plate and a second frame plate with respect to the first frame plate; and an electrolyte channel defined within the first frame plate and the second frame plate to accommodate a liquid electrolyte, wherein both a surface of the first frame plate and a surface of the second frame plate include a vacuum suction area, the vacuum suction area includes a vacuum aperture and a vacuum channel, wherein the vacuum aperture is formed on at least one surface of the first frame plate and the second frame plate, the vacuum channel is positioned inside the first frame plate and the second frame plate, and is configured to generate a longitudinal pressing suction force and seal the first frame plate and the second frame plate.

Abstract: A wafer-measuring fixture suitable for carrying a broken wafer is described. The wafer-measuring fixture comprises a base having a carrying component. The carrying component is used to hold the broken wafer. Furthermore, a plurality of scale marks is set around the carrying component to mark the broken positions on the wafer.

Abstract: A wafer-measuring fixture suitable for carrying a broken wafer is described. The wafer-measuring fixture comprises a base having a carrying component. The carrying component is used to hold the broken wafer. Furthermore, a plurality of scale marks is set around the carrying component to mark the broken positions on the wafer.

Abstract: A telephone includes: an interface circuit for coupling an external line; a control circuit coupled to the interface circuit for controlling the operation of the telephone; a host device controller coupled to the control circuit, wherein the host device controller is utilized for coupling to an external storage device, and the control circuit controls the host device controller to read an audio file stored in the external storage device; an audio output device coupled to the host device controller for playing the audio file read by the host device controller; and a keypad coupled to the control circuit for dialing or inputting information into the control circuit.

Abstract: An answering machine includes: an interface module for coupling an external line; a host device controller for coupling to an external storage device, wherein the host device controller is utilized for accessing the external storage device; a control circuit coupled to the interface module and the host device controller for controlling the host device controller to access the external storage device; and an audio output device coupled to the control circuit, wherein the audio output device is capable of being utilized for playing an audio message stored in the external storage device.