Abstract: A scanner includes a scan flatbed, an optical module, a driving source, and an exposure control unit. The scan flatbed is for carrying a to-be-scanned document. The optical module includes a photo sensing device, for reading N scan lines of the to-be-scanned document. The driving source, used for driving the optical module, includes an encoder for outputting a position signal corresponding to a position of the optical module. The exposure control unit, including a timer, controls exposure time for each scan line to be constant according to the position signal. The scan method includes driving the optical module to read the scan lines of the to-be-scanned document and output the corresponding position signal; and controlling the photo sensing device to read each scan line of the to-be-scanned document for a constant period of time according to the position signal.

Abstract: A plasma sputtering target assembly and a method therefor are provided. The sputtering target assembly includes a target, a bonding layer having a plurality of particles and having a first side bonded with the target and second side, and a backplate bonded with the second side of the bonding layer. The particles are being provided when the backplate is heated. Alternatively, a plurality of protrusions is formed on the backplate and the bonding layer is larger than or equal to the protrusions in altitude. Since the bonding layer has a composition and sputter yield of the part different from that of the target, in sputtering, the bonding layer is made exposed to plasma and thus an exceptional discharging phenomenon is caused when the target is struck through. By detecting the phenomenon, whether the target is almost over-sputtered may be forecasted and the backplate may be prevented from being struck through.

Abstract: A semiconductor device and its manufacturing method are disclosed. The nitrogen flow is gradually changed to form a semiconductor device with a gate or a source/drain having a nitrified gradient layer structure. Different extents of nitrification inside the nitrified gradient layer structure provide protection and buffering to prevent the undercut after etching due to different materials in the multilayer structure or the interface effect.

Abstract: A semiconductor device and its manufacturing method are disclosed. The nitrogen flow is gradually changed to form a semiconductor device with a gate or a source/drain having a nitrified gradient layer structure. Different extents of nitrification inside the nitrified gradient layer structure provide protection and buffering to prevent the undercut after etching due to different materials in the multilayer structure or the interface effect.

Abstract: A scanner includes a scan flatbed, an optical module, a driving source, and an exposure control unit. The scan flatbed is for carrying a to-be-scanned document. The optical module includes a photo sensing device, for reading N scan lines of the to-be-scanned document. The driving source, used for driving the optical module, includes an encoder for outputting a position signal corresponding to a position of the optical module. The exposure control unit, including a timer, controls exposure time for each scan line to be constant according to the position signal. The scan method includes driving the optical module to read the scan lines of the to-be-scanned document and output the corresponding position signal; and controlling the photo sensing device to read each scan line of the to-be-scanned document for a constant period of time according to the position signal.

Abstract: A scanner includes an optical module, a driving device, a digital gain unit and a timer. The optical module includes a photo sensing device for reading N scan lines and outputs digital image data. The driving device drives the optical module and has a position detecting device for outputting a position feedback signal corresponding to a position of the optical module. The digital gain unit performs a digital gain process on the digital image data. The timer controls the digital gain process according to the position feedback signal. The method includes setting K to 1; driving the optical module to read a Kth scan line of the to-be-scanned document and outputting Kth image data; calculating Kth exposure time for the Kth scan line and performing a digital gain process on the Kth image data; and determining if K is smaller than N.