Patents by Inventor Hyang Bong Lee

Hyang Bong Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for detecting impurities in ammonium hydroxide
    Patent number: 10309937
    Abstract: Provided is a method for detecting impurities in ammonium hydroxide. The method for detecting impurities in ammonium hydroxide includes preparing a potassium permanganate solution, preparing ammonium hydroxide, and adding the potassium permanganate solution several times to the ammonium hydroxide so as to detect impurities in the ammonium hydroxide. Potassium permanganate contained in the potassium permanganate solution is added for each time in the range of 0.0001 mol to 0.01 mol per 1 g of ammonia contained in the ammonium hydroxide.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: June 4, 2019
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Kihyun Kim, Sooyeon Kim, JungDae Park, Min Soo Suh, Hyang Bong Lee, Kwangshin Lim
  • METHOD FOR DETECTING IMPURITIES IN AMMONIUM HYDROXIDE
    Publication number: 20170219538
    Abstract: Provided is a method for detecting impurities in ammonium hydroxide. The method for detecting impurities in ammonium hydroxide includes preparing a potassium permanganate solution, preparing ammonium hydroxide, and adding the potassium permanganate solution several times to the ammonium hydroxide so as to detect impurities in the ammonium hydroxide. Potassium permanganate contained in the potassium permanganate solution is added for each time in the range of 0.0001 mol to 0.01 mol per 1 g of ammonia contained in the ammonium hydroxide.
    Type: Application
    Filed: December 29, 2016
    Publication date: August 3, 2017
    Inventors: Kihyun Kim, Sooyeon Kim, JungDae Park, Min Soo Suh, Hyang Bong Lee, Kwangshin Lim