Abstract: A quantification method of functional groups in an organic thin layer includes: a) measuring an absolute quantity per unit area of an analysis reference material having functional groups included in a reference organic thin layer by means of MEIS spectroscopy; b) carrying out spectrometry for the same reference organic thin layer as in a) and thereby obtaining peak intensities of the functional groups in the reference organic thin layer; c) carrying out the same spectrometry as in b) for an organic thin layer to be analyzed having the same functional groups and thereby measuring peak intensities of the functional groups with unknown quantity; and d) comparing the peak intensities of the functional groups measured in b) with respect to the absolute quantity of the analysis reference material in a) and thereby determining the absolute quantity per unit area of the functional groups with unknown quantity measured in c).

Abstract: A quantification method of functional groups in an organic thin layer includes: a) measuring an absolute quantity per unit area of an analysis reference material having functional groups included in a reference organic thin layer by means of MEIS spectroscopy; b) carrying out spectrometry for the same reference organic thin layer as in a) and thereby obtaining peak intensities of the functional groups in the reference organic thin layer; c) carrying out the same spectrometry as in b) for an organic thin layer to be analyzed having the same functional groups and thereby measuring peak intensities of the functional groups with unknown quantity; and d) comparing the peak intensities of the functional groups measured in b) with respect to the absolute quantity of the analysis reference material in a) and thereby determining the absolute quantity per unit area of the functional groups with unknown quantity measured in c).

Abstract: A method of evaluating conjugation between materials using imaging of time-of-flight secondary ion mass spectrometry (TOF-SIMS) according to the present invention is carried out by following the steps, a) forming a spontaneous pattern on a substrate with a mixture containing nanoparticles and a conjugation material selected from organic, bio or inorganic material, b) obtaining an ion detection pattern from the conjugation material and nanoparticles, respectively, depending on their position on the substrate by using time-of-flight secondary ion mass spectrometry, and c) determining whether the conjugation is formed between the conjugation material and nanoparticles by comparing the ion detection pattern of the conjugation material with the ion detection pattern of the nanoparticles.

Abstract: A method of evaluating conjugation between materials using imaging of time-of-flight secondary ion mass spectrometry (TOF-SIMS) according to the present invention is carried out by following the steps which comprise, a) forming a spontaneous pattern on a substrate with a mixture comprising nanoparticles and a conjugation material selected from organic, bio or inorganic material, b) obtaining an ion detection pattern from said conjugation material and said nanoparticles, respectively, depending on their position on the substrate by using time-of-flight secondary ion mass spectrometry, and c) determining whether the conjugation is formed between said conjugation material and said nanoparticles by comparing the ion detection pattern of said conjugation material with the ion detection pattern of said nanoparticles.