Abstract: In a computer system including a processor; and a memory storing a program code executable by the processor, wherein the processor performs steps of laying out facilities disposed in a semiconductor FAB through a first layout method or a second layout method and simulating a result according to the layout method; and comparing the simulated result through various parameters.

Abstract: A batch chemical analyzer is disclosed, the analyzer including a reaction tank (100) in which sample and reagent are mixed, a detector (200), a switching valve (300), a multi-port valve (400), a pump (500) and an air suction/discharge hole (600), and particularly, the switching valve (300) includes a plurality of holes (301˜310) configured to receive sample and reagent and to send the same to the reaction tank (100) and the detector (200) for discharge to the outside, and the rotor (320) formed with a plurality of inlets (321˜325) simultaneously communicating with two adjacent holes of the plurality of holes (301˜310), whereby the two adjacent holes are differently paired to be communicated in two ways by the rotation of the rotor (320).

Abstract: A batch chemical analyzer is disclosed, the analyzer including a reaction tank (100) in which sample and reagent are mixed, a detector (200), a switching valve (300), a multi-port valve (400), a pump (500) and an air suction/discharge hole (600), and particularly, the switching valve (300) includes a plurality of holes (301˜310) configured to receive sample and reagent and to send the same to the reaction tank (100) and the detector (200) for discharge to the outside, and the rotor (320) formed with a plurality of inlets (321˜325) simultaneously communicating with two adjacent holes of the plurality of holes (301˜310), whereby the two adjacent holes are differently paired to be communicated in two ways by the rotation of the rotor (320).