Abstract: A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.

Abstract: A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.

Abstract: A TFT array inspecting apparatus inspects a TFT array disposed at either an inclined position and a level position. The TFT array inspecting apparatus includes a vacuum chamber, a stage disposed in the vacuum chamber so that a TFT array to be inspected is disposed on the stage, an electron gun disposed opposite to the stage in the vacuum chamber to generate an electron beam onto the TFT array, an electron detecting unit to detect secondary electrons emitted from the TFT array by the electron gun, and at least one elevating unit to move the TFT array move between a level position and an inclined position having a designated angle with the level position.

Abstract: An inspection apparatus for a TFT substrate formed with a plurality of pixels, includes a reference substrate being opposite to and spaced from the TFT substrate and formed with a plurality of reference patterns corresponding to the pixels, a power supply to supply power to both a predetermined number of the pixels and the corresponding reference pattern to form an electric field in a space between the TFT substrate and the reference substrate, an electron beam emitter to emit an electron beam to travel from a first side to a second side of the space, an electron beam detector to detect the electron beam emitted from the electron beam emitter and passed through the space, and a controller to determine whether the TFT substrate includes a defective pixel based on a location of the electron beam detected by the electron beam detector. Thus, the inspection apparatus can correctly and quickly inspect the TFT substrate for defects in a low vacuum state regardless a size of the TFT substrate.

Abstract: An optical system to attain a clear image of an object when the object is photographed in a state where an optical axis of a lens is inclined relative to the object, includes a lens which refracts light radiating from the object, an image producing surface on which the image of the object is produced according to the light refracted by the lens, and an image producing surface control unit which controls the image producing surface to move with respect to the lens. The image producing surface control unit includes an angle control unit to control an angle between an optical axis of the lens and the image producing surface.

Abstract: A panel inspection apparatus inspecting a display panel, including: a panel supporting table supporting the panel; a plurality of cameras installed being spaced from the panel supporting table and photographing the panel supported by the panel supporting table; and a rotatable camera support rotatably supporting at least one of the plurality of cameras. As a result, the number of cameras required is reduced, costing less, and easy installation.

Abstract: An inspection apparatus for a TFT substrate formed with a plurality of pixels, includes a reference substrate being opposite to and spaced from the TFT substrate and formed with a plurality of reference patterns corresponding to the pixels, a power supply to supply power to both a predetermined number of the pixels and the corresponding reference pattern to form an electric field in a space between the TFT substrate and the reference substrate, an electron beam emitter to emit an electron beam to travel from a first side to a second side of the space, an electron beam detector to detect the electron beam emitted from the electron beam emitter and passed through the space, and a controller to determine whether the TFT substrate includes a defective pixel based on a location of the electron beam detected by the electron beam detector. Thus, the inspection apparatus can correctly and quickly inspect the TFT substrate for defects in a low vacuum state regardless a size of the TFT substrate.

Abstract: An optical system to attain a clear image of an object when the object is photographed in a state where an optical axis of a lens is inclined relative to the object, includes a lens which refracts light radiating from the object, an image producing surface on which the image of the object is produced according to the light refracted by the lens, and an image producing surface control unit which controls the image producing surface to move with respect to the lens. The image producing surface control unit includes an angle control unit to control an angle between an optical axis of the lens and the image producing surface.

Abstract: A panel inspection apparatus inspecting a display panel, including: a panel supporting table supporting the panel; a plurality of cameras installed being spaced from the panel supporting table and photographing the panel supported by the panel supporting table; and a rotatable camera support rotatably supporting at least one of the plurality of cameras. As a result, the number of cameras required is reduced, costing less, and easy installation.

Abstract: An image processing system and an image processing method which correct a moiré in an image taken from a displayed image. An imaging taking apparatus takes an image of an image displayed by an image displaying apparatus and an optical characteristic changing apparatus is provided between the image taking apparatus and the image displaying apparatus. A lightpath of the displayed image is changed before the image of the displayed image is taken and an image processor receives a plurality of the taken images from the image taking apparatus and generates a processed image with a removed moiré by correcting or superposing the plurality of the images. Thus, a processed image, in which a moiré of the displayed image is removed, is promptly obtainable, and a quality of the taken image is increased. The image processing system and method are adaptable to various systems for inspection and/or measurement.

Abstract: An apparatus and a method for inspecting an image, synchronizing a pattern frame synchronizing signal and an image frame synchronizing signal to initiate grabbing an inspection pattern, where the pattern frame synchronizing signal and the image frame synchronizing signal have different frequencies. With this configuration, where the frequencies of the pattern frame synchronizing signal and the image frame synchronizing signal are not identical, since grabbing an image of the inspection pattern is initiated by synchronizing the image frame synchronizing signal with the pattern frame synchronizing signal, the noise inserted into the image of the inspection pattern becomes regular, thereby resulting in enhancing the reliability of the image inspection.

Abstract: An apparatus and a method for inspecting an image, synchronizing a pattern frame synchronizing signal and an image frame synchronizing signal to initiate grabbing an inspection pattern, where the pattern frame synchronizing signal and the image frame synchronizing signal have different frequencies. With this configuration, where the frequencies of the pattern frame synchronizing signal and the image frame synchronizing signal are not identical, since grabbing an image of the inspection pattern is initiated by synchronizing the image frame synchronizing signal with the pattern frame synchronizing signal, the noise inserted into the image of the inspection pattern becomes regular, thereby resulting in enhancing the reliability of the image inspection.