Patents by Inventor Hyeung Ill LEE

Hyeung Ill LEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for generating prediction model based on artificial neural network
    Patent number: 11250308
    Abstract: Disclosed is an apparatus for generating an artificial-neural-network-based prediction model. The apparatus includes an input data conversion unit configured to convert input data of an L-dimensional array (L is a natural number) into normalized vector data and input the normalized vector data, a modeling unit configured to model an artificial-neural-network-based prediction model for learning the input vector data and output a value predicted through the modeling, and an adjustment unit configured to compare the value predicted by the modeling unit with an actually measured value to calculate an error value and adjust learning parameters of an artificial neural network using the error value and a back-propagation algorithm.
    Type: Grant
    Filed: May 31, 2017
    Date of Patent: February 15, 2022
    Assignees: Seoul National University R&DB Foundation, eCubesolutions Co., Ltd.
    Inventors: Jung Woo Lee, Hyeung Ill Lee
  • APPARATUS AND METHOD FOR GENERATING PREDICTION MODEL BASED ON ARTIFICIAL NEURAL NETWORK
    Publication number: 20170351948
    Abstract: Disclosed is an apparatus for generating an artificial-neural-network-based prediction model. The apparatus includes an input data conversion unit configured to convert input data of an L-dimensional array (L is a natural number) into normalized vector data and input the normalized vector data, a modeling unit configured to model an artificial-neural-network-based prediction model for learning the input vector data and output a value predicted through the modeling, and an adjustment unit configured to compare the value predicted by the modeling unit with an actually measured value to calculate an error value and adjust learning parameters of an artificial neural network using the error value and a back-propagation algorithm.
    Type: Application
    Filed: May 31, 2017
    Publication date: December 7, 2017
    Applicants: Seoul National University R&DB Foundation, eCubesolutions Co., Ltd.
    Inventors: Jung Woo LEE, Hyeung Ill LEE