Abstract: A device and method for etching a wire to manufacture it into a tip for a scanning probe microscope or the like. The wire etching device generates a voltage signal for determining the level of a wire etching voltage, and applies the etching voltage of the level determined depending on the generated voltage signal to the wire to primarily etch it. The wire etching device measures the amount of etching current generated during the primary etching process and controls the level of the voltage signal according to the measured etching current amount so as to control the level of the etching voltage. Then, the device secondarily etches the wire with the level-controlled voltage signal. Therefore, the wire etching device can manufacture the tip while controlling its curvature radius and aspect ratio and reducing the amount of oxide on its surface.

Abstract: A fine friction and wear test apparatus for a plate specimen comprises a fixing unit a driving unit installed on the fixing unit for fixing and moving a certain plate specimen, a ball specimen support member for rubbing and wearing the plate specimen, a rotation plate position controller fixed on the fixing unit for controlling the position of the ball specimen support member, a ball specimen controller for controlling the ball specimen support member, a controller for detecting the degree of a friction and wear of the plate specimen and controlling each mechanical and circuit part; and a power supply unit for supplying a power to a part which requires a certain power.

Abstract: A fine friction and wear test apparatus for a plate specimen comprises a fixing unit, a driving unit installed on the fixing unit for fixing and moving a certain plate specimen, a ball specimen support member for rubbing and wearing the plate specimen, a rotation plate position controller fixed on the fixing unit for controlling the position of the ball specimen support member, a ball specimen controller for controlling the ball specimen support member, a controller for detecting the degree of a friction and wear of the plate specimen and controlling each mechanical and circuit part; and a power supply unit for supplying a power to a part which requires a certain power.

Abstract: The present invention relates to a two-phase scanning method and apparatus for obtaining information necessary to analyze physical properties of materials using a scanning probe microscope. The scanning operation of the present invention is divided into two phases. First, in order to obtain information on a surface of a sample, a first scan is provided while the probe moves along the sample surface. Based upon results of the first scan, an imaginary line is defined on an average plane of the sample surface. Then, an imaginary plane, one side of which intersects the imaginary line and makes a predetermined angle with reference to the average plane, is defined over an area of interest on the sample surface. The probe is then positioned at a predetermined height on the imaginary inclined plane, and a second scan is provided during downward movement of the probe along the imaginary inclined plane.

Abstract: A device and method for etching a wire to manufacture it into a tip for a scanning probe microscope or the like. The wire etching device generates a voltage signal for determining the level of a wire etching voltage, and applies the etching voltage of the level determined depending on the generated voltage signal to the wire to primarily etch it. The wire etching device measures the amount of etching current generated during the primary etching process and controls the level of the voltage signal according to the measured etching current amount so as to control the level of the etching voltage. Then, the device secondarily etches the wire with the level-controlled voltage signal. Therefore, the wire etching device can manufacture the tip while controlling its curvature radius and aspect ratio and reducing the amount of oxide on its surface.

Abstract: Disclosed herein is a fine friction and wear testing apparatus. The fine friction and wear testing apparatus includes a working table to whose upper surface a plate specimen is secured. First drive means horizontally reciprocates the working table. A support arm is situated over the working table and securely holds a roundly tipped specimen to be projected downwardly. First sensing means senses the horizontal displacement of the plate specimen. Second drive means operates the support arm to exert a load on the plate specimen through the roundly tipped specimen. Second sensing means senses the displacement of the roundly tipped specimen. A control unit operates the first and second drive means in accordance with set values and calculates the displacements sensed by the first and second sensing means. A display shows the friction and wear characteristics of the specimens to users in real time.

Abstract: A method and apparatus for automatically recognizing blood cells is provided. The method comprises obtaining image data of said blood cells, storing the image data of said blood cells in a memory, analyzing the image data of said blood cells and calculating a plurality of cell-characteristic parameter values for each of said blood cells, and recognizing each of said blood cells based on said plurality of cell-characteristic parameter values. In order to analyze the image data of blood cells, a group of nucleus pixels are first extracted from said stored image data and stored in the memory. The group of nucleus pixels are then segmented into individual nucleus clusters which represent each of the blood cells, and the data of the individual nucleus clusters are stored together with the associated cytoplasm data in the memory. Cell-characteristic parameter values for each of the blood cells are calculated based on its nucleus and associated cytoplasm data.