Patents by Inventor Hyock-Jun Lee

Hyock-Jun Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test pattern and method of monitoring defects using the same
    Patent number: 7705621
    Abstract: A test pattern includes a normal pattern, an abnormal pattern having predetermined defects, and a conductive line electrically connected to the normal pattern and electrically isolated from the abnormal pattern. Thus, a non-contact test process and a contact test process may be compatible with the single test pattern.
    Type: Grant
    Filed: September 10, 2007
    Date of Patent: April 27, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyock-Jun Lee, Choel-Hwyi Bae, Yeong-Lyeol Park, Nam-Young Lee, Mi-Joung Lee
  • TEST PATTERN AND METHOD OF MONITORING DEFECTS USING THE SAME
    Publication number: 20080084223
    Abstract: A test pattern includes a normal pattern, an abnormal pattern having predetermined defects, and a conductive line electrically connected to the normal pattern and electrically isolated from the abnormal pattern. Thus, a non-contact test process and a contact test process may be compatible with the single test pattern.
    Type: Application
    Filed: September 10, 2007
    Publication date: April 10, 2008
    Inventors: Hyock-Jun Lee, Choel-Hwyi Bae, Yeong-Lyeol Park, Nam-Young Lee, Mi-Joung Lee