Abstract: In a modeling method of a neural network, a first regression model is trained based on first sample data and first simulation result data. The first regression model is used to predict the first simulation result data from the first sample data. The first sample data represent at least one of conditions of a manufacturing process of a semiconductor device and characteristics of the semiconductor device. The first simulation result data are obtained by performing a simulation on the first sample data. In response to a consistency of the first regression model being lower than a target consistency, the first regression model is re-trained based on second sample data different from the first sample data. The second sample data are associated with a consistency reduction factor of the first regression model that is responsible for a prediction failure of the first regression model.

Abstract: Embodiments relate to an Inertia Measurement Unit (IMU) sensor that generates strain information including a change in strain based on first output light of a first type of optical fiber sensing unit, calculates acceleration information of an object on which an IMU sensor (10) is mounted based on the strain information, generates angular velocity information based on output light of a second type of optical fiber sensing unit, and calculates angle information of the object based on the rotational speed information.

Abstract: A method of generating a simulation model based on simulation data and measurement data of a target includes classifying weight parameters, included in a pre-learning model learned based on the simulation data, as a first weight group and a second weight group based on a degree of significance, retraining the first weight group of the pre-learning model based on the simulation data, and training the second weight group of a transfer learning model based on the measurement data, wherein the transfer learning model includes the first weight group of the pre-learning model retrained based on the simulation data.

Abstract: A sensor assembly has a flexible body, and a plurality of fiber Bragg gratings (FBG) sensor inserted into the body, the FBG sensor includes an optical fiber extending in a length direction of the body and a plurality of lattices disposed in the optical fiber, a variation of a wavelength spectrum of light, caused by a variation of an interval of the plurality of lattices, is detected, and at least one of force information applied to the body and temperature information of the body is extracted together with refraction information of the body.

Abstract: A sensor assembly has a flexible body, and a plurality of fiber Bragg gratings (FBG) sensor inserted into the body, the FBG sensor includes an optical fiber extending in a length direction of the body and a plurality of lattices disposed in the optical fiber, a variation of a wavelength spectrum of light, caused by a variation of an interval of the plurality of lattices, is detected, and at least one of force information applied to the body and temperature information of the body is extracted together with refraction information of the body.

Abstract: A probe sensor has a probe structure having a probe body inserted into an experiment subject, a block body disposed on the probe body to transmit or reflect an incident light, and a light irradiation body for inputting a first incident light to the block body; a first light source for generating the first incident light and transmitting to the light irradiation body; and a light analyzer for analyzing a first reflection light which is a reflection light of the first incident light reflected by the block body, wherein the length of the block body changes according to a temperature change, and wherein the light analyzer measures a temperature change of the experiment subject by detecting a wavelength change of the first reflection light according to the length change of the block body.

Abstract: A probe sensor has a probe structure having a probe body inserted into an experiment subject, a block body disposed on the probe body to transmit or reflect an incident light, and a light irradiation body for inputting a first incident light to the block body; a first light source for generating the first incident light and transmitting to the light irradiation body; and a light analyzer for analyzing a first reflection light which is a reflection light of the first incident light reflected by the block body, wherein the length of the block body changes according to a temperature change, and wherein the light analyzer measures a temperature change of the experiment subject by detecting a wavelength change of the first reflection light according to the length change of the block body.