Abstract: A test device for performing a bling scan includes a digital blind scan circuit. The blind scan circuit includes digital detectors for multiple cellular technologies that simultaneously perform correlation in a baseband frequency range to detect whether received RF signals include a channel of the technologies. The test device launches, responsive to detecting a channel from the blind scan, a signal analysis or a spectrum analysis application for the channel according to a carrier frequency and a technology identified for the channel by the blind scan.

Abstract: A test device may be a portable test device that can perform over the air measurements to determine synchronization errors between clusters in a cellular network. The test device can generate a graphical user interface that can show a map of the boundary area between clusters, locations of base stations in the boundary area, locations where over the air measurements were taken by the test device, an indication of whether cells are in synchronization for each measurement location, and a table of actual measurements and derived parameters pertaining to cell phase synchronization, interference and other performance metrics.

Abstract: A test device may be a portable test device that can perform over the air measurements to determine synchronization errors between clusters in a cellular network. The test device can generate a graphical user interface that can show a map of the boundary area between clusters, locations of base stations hi the boundary area, locations where over the air measurements were taken by the test device, an indication of whether cells are in synchronization for each measurement location, and a table of actual measurements and derived parameters pertaining to cell phase synchronization, interference and other performance metrics.

Abstract: According to examples, NR and LTE signal concurrent testing may include ascertaining LTE synchronization data associated with an LTE signal, and ascertaining NR synchronization data associated with an NR signal. The NR and LTE signal concurrent testing may further include performing, for the LTE synchronization data, LTE analysis, and performing, for the NR synchronization data, NR analysis. Based on the LTE analysis and the NR analysis, a multi-path profile of the LTE signal and the NR signal may be determined.

Abstract: A test device may be a portable test device that can perform over the air measurements to determine synchronization errors between clusters in a cellular network. The test device can generate a graphical user interface that can show a map of the boundary area between clusters, locations of base stations in the boundary area, locations where over the air measurements were taken by the test device, an indication of whether cells are in synchronization for each measurement location, and a table of actual measurements and derived parameters pertaining to cell phase synchronization, interference and other performance metrics.

Abstract: A test device is operable to detect interference in a time division duplex (TDD) cellular network. The test device can automatically detect a TDD frame structure of RF signals received over the air Eagle Eye from a cell site. The test device determines a transition period between uplink (UL) and downlink (DL) transmissions in which no UL and DL signals are being transmitted based on the TDD frame structure. An interference signal is detected during the transition period, and the test device can generate a display of the spectrum during the transition period that includes the interference signal.

Abstract: A test device for performing a bling scan includes a digital blind scan circuit. The blind scan circuit includes digital detectors for multiple cellular technologies that simultaneously perform correlation in a baseband frequency range to detect whether received RF signals include a channel of the technologies. The test device launches, responsive to detecting a channel from the blind scan, a signal analysis or a spectrum analysis application for the channel according to a carrier frequency and a technology identified for the channel by the blind scan.

Abstract: According to examples, NR and LTE signal concurrent testing may include ascertaining LTE synchronization data associated with an LTE signal, and ascertaining NR synchronization data associated with an NR signal. The NR and LTE signal concurrent testing may further include performing, for the LTE synchronization data, LTE analysis, and performing, for the NR synchronization data, NR analysis. Based on the LTE analysis and the NR analysis, a multi-path profile of the LTE signal and the NR signal may be determined.

Abstract: According to examples, NR and LTE signal concurrent testing may include ascertaining LTE synchronization data associated with an LTE signal, and ascertaining NR synchronization data associated with an NR signal. The NR and LTE signal concurrent testing may further include performing, for the LTE synchronization data, LTE analysis, and performing, for the NR synchronization data, NR analysis. Based on the LTE analysis and the NR analysis, a mufti-path profile of the LTE signal and the NR signal may be determined.

Abstract: A vertical stack transistor includes: a first transistor and a second transistor, located in a vertical direction, wherein the first transistor includes a first gate electrode, a first insulating layer, a first electrode, a first channel, and a second electrode, which are sequentially stacked in the vertical direction, and the second transistor includes a second gate electrode, a second insulating layer, a third electrode, a second channel, and a fourth electrode, which are sequentially stacked in the vertical direction, wherein the second gate electrode and the second electrode are the same electrode.

Abstract: An image pickup device includes an active pixel sensor (APS), a row driver, and a leakage current breaker. The active pixel sensor includes an array of a plurality of pixels. The row driver selects at least one pixel to be activated to output signals. The leakage current breaker decreases the leakage current through the unselected pixels by applying a leakage current breaker voltage at the bit lines of the APS array.

Abstract: An image sensor includes a photosensitive device and a drive transistor for generating an electrical signal from charge accumulated in the photosensitive device. The drive transistor includes a source region of a first conductivity type and an asymmetry junction region abutting a portion of the source region and being of a second conductivity type that is opposite of the first conductivity type. The drive transistor is biased such that the asymmetry junction region reduces an effective channel length of the drive transistor.