Patents by Inventor Hyuk Jung KWON

Hyuk Jung KWON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190180881
    Abstract: The present invention relates to a non-invasive prenatal testing method and, more particularly, to a method for enhancing the sensitivity and accuracy of non-invasive prenatal testing by applying multi-dimensional threshold values based on multiple Z-scores. Designed to reduce false-positive and false-negative possibility by applying two or more Z-score threshold values to aneuploidy detection for one chromosome, the non-invasive prenatal testing method according to the present invention exhibits the effect of obtaining a more sensitive and more accurate test result. Further, the method can minimize test errors in spite of using a small number of nucleotide sequence fragments, with the resultant effect of reducing an experiment cost and thus expensive testing cost and rapidly performing testing with a low expense.
    Type: Application
    Filed: June 9, 2017
    Publication date: June 13, 2019
    Applicant: EONE DIAGNOMICS GENOME CENTER CO., LTD
    Inventors: Min Seob LEE, Shang Cheol SHIN, Sung Hoon LEE, Hyuk Jung KWON