Patents by Inventor Hyukyong Kwon

Hyukyong Kwon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test solution for a random number generator
    Patent number: 9231567
    Abstract: A random number generator and method for testing the same are described. In one embodiment, the random number generator comprises one or more ring oscillator structures, each of the one or more ring oscillator structures having a ring oscillator for use in generating random numbers and having a test structure to reconfigure the ring oscillator into a testable structure.
    Type: Grant
    Filed: February 28, 2014
    Date of Patent: January 5, 2016
    Assignee: Lattice Semiconductor Corporation
    Inventors: Chinsong Sul, Hyukyong Kwon, Andy Ng
  • Test solution for ring oscillators
    Patent number: 8841974
    Abstract: A method and apparatus is disclosed herein for testing of multiple ring oscillators. In one embodiment, the apparatus comprises at least one ring oscillator structure having a ring oscillator having an inverter chain with an odd number of inverters connected back-to-back and operable to produce an oscillatory output, and a test structure coupled to provide either an observability chain input or a test input to the ring oscillator and to receive the oscillatory output as a feedback from the ring oscillator.
    Type: Grant
    Filed: September 6, 2012
    Date of Patent: September 23, 2014
    Assignee: Silicon Image, Inc.
    Inventors: Chinsong Sul, Hyukyong Kwon, Andy Ng
  • Test Solution for a Random Number Generator
    Publication number: 20140191813
    Abstract: A random number generator and method for testing the same are described. In one embodiment, the random number generator comprises one or more ring oscillator structures, each of the one or more ring oscillator structures having a ring oscillator for use in generating random numbers and having a test structure to reconfigure the ring oscillator into a testable structure.
    Type: Application
    Filed: February 28, 2014
    Publication date: July 10, 2014
    Applicant: Silicon Image, Inc.
    Inventors: Chinsong Sul, Hyukyong Kwon, Andy Ng
  • TEST SOLUTION FOR RING OSCILLATORS
    Publication number: 20140062606
    Abstract: A method and apparatus is disclosed herein for testing of multiple ring oscillators. In one embodiment, the apparatus comprises at least one ring oscillator structure having a ring oscillator having an inverter chain with an odd number of inverters connected back-to-back and operable to produce an oscillatory output, and a test structure coupled to provide either an observability chain input or a test input to the ring oscillator and to receive the oscillatory output as a feedback from the ring oscillator.
    Type: Application
    Filed: September 6, 2012
    Publication date: March 6, 2014
    Inventors: Chinsong Sul, Hyukyong Kwon, Andy Ng