Abstract: Disclosed are a hybrid electric vehicle and a method for controlling an engine speed of a hybrid electric vehicle. In particular, the method includes: determining, when an engine on one end and a first motor are directly connected and while driving in a state where an engine clutch is connected and a second motor is connected to the other end, a compensation value based on the difference in the rotational speed of the engine and the second motor when a control entry is caused, which induces the rotational speed mismatch of the engine and the second motor; and compensating an output torque of the first motor based on the compensation value.

Abstract: Disclosed is a hybrid electric vehicle and a method of controlling an engine stop for the vehicle. The method includes: determining whether a first condition and a second condition is satisfied; applying a negative torque to the motor when the first condition and the second condition are satisfied; predicting occurrence of reverse rotation of the engine; and applying a feedback torque for satisfying the target behavior of the engine to the motor when the occurrence of the reverse rotation is predicted.

Abstract: Disclosed is an apparatus for spinning a test tray and an in-line test handler including the above apparatus, wherein the apparatus may include a supporting unit for supporting a test tray transported between first and second chamber units facing in the different directions, wherein the first chamber unit is provided at a predetermined interval from the second chamber unit; a base unit to which the supporting unit is spinnably connected; and a spinning unit which spins the test tray so that semiconductor devices received in the test tray are tested at the same arrangement in each of the first chamber unit and the second chamber unit.

Abstract: Disclosed is an apparatus for spinning a test tray and an in-line test handler including the above apparatus, wherein the apparatus may include a supporting unit for supporting a test tray transported between first and second chamber units facing in the different directions, wherein the first chamber unit is provided at a predetermined interval from the second chamber unit; a base unit to which the supporting unit is spinnably connected; and a spinning unit which spins the test tray so that semiconductor devices received in the test tray are tested at the same arrangement in each of the first chamber unit and the second chamber unit.