Patents by Inventor Hyun-deok Park

Hyun-deok Park has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuits and methods for testing logic devices by modulating a test voltage with a noise signal
    Patent number: 6286117
    Abstract: Noise is introduced into test inputs and voltage supplies provided to logic devices while under going testing by modulating a test voltage output with a noise signal to produce the test input. In particular, a noise signal and a test voltage output are generated. The test voltage output is modulated with the noise signal to provide a test input to the logic device. A more accurate approximation of an actual operating environment is thereby provided.
    Type: Grant
    Filed: June 22, 1998
    Date of Patent: September 4, 2001
    Assignee: Samsung Electronics, Co., Ltd.
    Inventors: Sung-jun Yun, Ki-hun Jung, Yun-ki Kim, Hyun-deok Park