Patents by Inventor Hyun Ik Kim

Hyun Ik Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240072182
    Abstract: An optical sensor includes a substrate, a photoelectric element disposed on the substrate and that includes a first electrode, an intermediate layer disposed on the first electrode, and a second electrode disposed on the intermediate layer, a barrier layer disposed on the second electrode, an insulating layer that covers the photoelectric element and the barrier layer, and a bias electrode disposed on the insulating layer and electrically connected to the second electrode. The barrier layer is spaced apart from the first electrode.
    Type: Application
    Filed: November 6, 2023
    Publication date: February 29, 2024
    Inventors: KI JUNE LEE, JUNG HA SON, TAE SUNG KIM, JAE IK LIM, HYUN MIN CHO
  • Patent number: 10613141
    Abstract: A clock jitter measurement circuit includes: an internal signal generator configured to generate a single pulse signal and an internal clock signal which are both synchronized with an input clock signal received by the clock jitter measurement circuit, a plurality of edge delay cells serially connected to each other and configured to generate a plurality of edge detection signals respectively corresponding to a plurality of delay edges obtained by delaying an edge of the internal clock signal, a plurality of latch circuits configured to latch the single pulse signal in synchronization with the plurality of edge detection signals and output a plurality of sample signals, and a count sub-circuit configured to count a number of activated sample signals of the plurality of sample signals and output a count value based on the counted number of activated sample signals.
    Type: Grant
    Filed: June 18, 2019
    Date of Patent: April 7, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kang-Yeop Choo, Hyun-Ik Kim, Woo-Seok Kim, Jung-Ho Kim, Ji-Hyun Kim, Tae-Ik Kim
  • Publication number: 20190346504
    Abstract: A clock jitter measurement circuit includes: an internal signal generator configured to generate a single pulse signal and an internal clock signal which are both synchronized with an input clock signal received by the clock jitter measurement circuit, a plurality of edge delay cells serially connected to each other and configured to generate a plurality of edge detection signals respectively corresponding to a plurality of delay edges obtained by delaying an edge of the internal clock signal, a plurality of latch circuits configured to latch the single pulse signal in synchronization with the plurality of edge detection signals and output a plurality of sample signals, and a count sub-circuit configured to count a number of activated sample signals of the plurality of sample signals and output a count value based on the counted number of activated sample signals.
    Type: Application
    Filed: June 18, 2019
    Publication date: November 14, 2019
    Inventors: KANG-YEOP CHOO, HYUN-IK KIM, WOO-SEOK KIM, JUNG-HO KIM, JI-HYUN KIM, TAE-IK KIM
  • Patent number: 10352997
    Abstract: A clock jitter measurement circuit includes: an internal signal generator configured to generate a single pulse signal and an internal clock signal which are both synchronized with an input clock signal received by the clock jitter measurement circuit, a plurality of edge delay cells serially connected to each other and configured to generate a plurality of edge detection signals respectively corresponding to a plurality of delay edges obtained by delaying an edge of the internal clock signal, a plurality of latch circuits configured to latch the single pulse signal in synchronization with the plurality of edge detection signals and output a plurality of sample signals, and a count sub-circuit configured to count a number of activated sample signals of the plurality of sample signals and output a count value based on the counted number of activated sample signals.
    Type: Grant
    Filed: August 2, 2018
    Date of Patent: July 16, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kang-Yeop Choo, Hyun-Ik Kim, Won-Seok Kim, Jung-Ho Kim, Ji-Hyun Kim, Tae-Ik Kim
  • Publication number: 20190041456
    Abstract: A clock jitter measurement circuit includes: an internal signal generator configured to generate a single pulse signal and an internal clock signal which are both synchronized with an input clock signal received by the clock jitter measurement circuit, a plurality of edge delay cells serially connected to each other and configured to generate a plurality of edge detection signals respectively corresponding to a plurality of delay edges obtained by delaying an edge of the internal clock signal, a plurality of latch circuits configured to latch the single pulse signal in synchronization with the plurality of edge detection signals and output a plurality of sample signals, and a count sub-circuit configured to count a number of activated sample signals of the plurality of sample signals and output a count value based on the counted number of activated sample signals.
    Type: Application
    Filed: August 2, 2018
    Publication date: February 7, 2019
    Inventors: KANG-YEOP CHOO, HYUN-IK KIM, WON-SEOK KIM, JUNG-HO KIM, JI-HYUN KIM, TAE-IK KIM
  • Patent number: 9989588
    Abstract: A circuit for measuring clock jitter includes: an internal signal generator configured to generate an internal clock signal and a single pulse signal, respectively synchronized with an input clock signal; a plurality of delay units being connected in series with each other and configured to generate respective delayed clock signals; a plurality of latch circuits configured to latch the single pulse signal in synchronization with the respective delayed clock signals, and output sampling signals; and a count sub-circuit configured to output a count value resulting from counting a number of active sampling signals of the sampling signals.
    Type: Grant
    Filed: February 14, 2017
    Date of Patent: June 5, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Kang-yeop Choo, Hyun-ik Kim, Tae-ik Kim, Ji-hyun Kim, Woo-seok Kim
  • Publication number: 20180011142
    Abstract: A circuit for measuring clock jitter includes: an internal signal generator configured to generate an internal clock signal and a single pulse signal, respectively synchronized with an input clock signal; a plurality of delay units being connected in series with each other and configured to generate respective delayed clock signals; a plurality of latch circuits configured to latch the single pulse signal in synchronization with the respective delayed clock signals, and output sampling signals; and a count sub-circuit configured to output a count value resulting from counting a number of active sampling signals of the sampling signals.
    Type: Application
    Filed: February 14, 2017
    Publication date: January 11, 2018
    Inventors: Kang-yeop CHOO, Hyun-ik KIM, Tae-ik KIM, Ji-hyun KIM, Woo-seok KIM
  • Publication number: 20180001258
    Abstract: A urea-water injector module is provided. The urea-water injector module includes an injector configured to discharge urea water to purify exhaust gas of a vehicle, a main body having the injector installed therein, and a plurality of heat dissipation plates stacked on an exterior surface of the main body to assist heat dissipation. Further the urea-water injector includes a heat block flange disposed under the heat dissipation plate and configured to obstruct heat from being transferred from an exhaust pipe and a mounting unit disposed under the heat block flange and coupled to the exhaust pipe.
    Type: Application
    Filed: June 29, 2017
    Publication date: January 4, 2018
    Inventors: Dong Hyun Kim, Se Hun Kim, Hyun Ik Kim