Patents by Inventor Hyun-Jung HER

Hyun-Jung HER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9472622
    Abstract: A semiconductor device includes an emitter electrode and a first field plate disposed on one surface of a substrate and spaced apart from each other, a collector electrode disposed on the other surface of the substrate, a trench gate disposed in the substrate, a field diffusion junction disposed in the substrate, and a first contact connecting the trench gate and the first field plate. The first field plate has a first part extending toward the emitter electrode with respect to the first contact and having a first width, and a second part extending toward the field diffusion junction with respect to the first contact and having a second width. The second width is greater than the first width.
    Type: Grant
    Filed: April 28, 2014
    Date of Patent: October 18, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jae-Hoon Lee, Tae-Geun Kim, Chan-Ho Park, Hyun-Jung Her
  • Patent number: 9406543
    Abstract: A semiconductor power device includes a substrate, a plurality of gate electrode structures, a floating well region and a termination ring region. The substrate has a first region and a second region. A plurality of gate electrode structures is formed on the substrate, each of the gate electrode structures extends from the first region to the second region and includes a first gate electrode, a second gate electrode and a connecting portion, the first and second gate electrodes extend in a first direction, and the connecting portion connects end portions of the first and second gate electrodes to each other. The floating well region is doped with impurities between the gate electrode structures in the first region of the substrate, and the floating well region has a first impurity concentration and a first depth.
    Type: Grant
    Filed: October 2, 2014
    Date of Patent: August 2, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jae-Hoon Lee, Tae-Geun Kim, Chan-Ho Park, Hyun-Jung Her
  • Publication number: 20150162443
    Abstract: In a semiconductor power device and method of the same, the semiconductor device includes a substrate, a gate electrode structure, first impurity regions, an insulating interlayer, first contact plugs and a first metal pattern. The substrate includes an active region and a termination region. The gate electrode structure includes a first gate electrode and a second gate electrode buried in the substrate, and upper surfaces of the gate electrode structure are lower than an upper surface of the substrate between the first and second gate electrodes. The first impurity regions are formed in the substrate between the first and second electrodes. The insulating interlayer having a flat top surface is formed on the substrate and the gate electrode structure. The first contact plugs are formed through the insulating interlayer, and the first contact plugs contact the first impurity regions. The first metal pattern having a flat top surface is formed on the first contact plugs and the insulating interlayer.
    Type: Application
    Filed: August 6, 2014
    Publication date: June 11, 2015
    Inventors: Jae-Hoon Lee, Tae-Geun Kim, Chan-Ho Park, Hyun-Jung Her
  • Publication number: 20150162423
    Abstract: A semiconductor power device includes a substrate, a plurality of gate electrode structures, a floating well region and a termination ring region. The substrate has a first region and a second region. A plurality of gate electrode structures is formed on the substrate, each of the gate electrode structures extends from the first region to the second region and includes a first gate electrode, a second gate electrode and a connecting portion, the first and second gate electrodes extend in a first direction, and the connecting portion connects end portions of the first and second gate electrodes to each other. The floating well region is doped with impurities between the gate electrode structures in the first region of the substrate, and the floating well region has a first impurity concentration and a first depth.
    Type: Application
    Filed: October 2, 2014
    Publication date: June 11, 2015
    Inventors: Jae-Hoon LEE, Tae-Geun KIM, Chan-Ho PARK, Hyun-Jung HER
  • Publication number: 20150021658
    Abstract: A semiconductor device includes an emitter electrode and a first field plate disposed on one surface of a substrate and spaced apart from each other, a collector electrode disposed on the other surface of the substrate, a trench gate disposed in the substrate, a field diffusion junction disposed in the substrate, and a first contact connecting the trench gate and the first field plate. The first field plate has a first part extending toward the emitter electrode with respect to the first contact and having a first width, and a second part extending toward the field diffusion junction with respect to the first contact and having a second width. The second width is greater than the first width.
    Type: Application
    Filed: April 28, 2014
    Publication date: January 22, 2015
    Inventors: Jae-Hoon LEE, Tae-Geun KIM, Chan-Ho PARK, Hyun-Jung HER