Patents by Inventor Hyun-Jung SOH

Hyun-Jung SOH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9842276
    Abstract: A system and method for analyzing a personalized characteristic are provided. The system includes an analysis range calculator configured to calculate a plurality of analysis ranges having different analysis times from positioning data according to a lapse of time of an analysis target; an image analyzer configured to identify one or more objects from the image data corresponding to each of the analysis ranges, and analyze one or more visual characteristics from each of the identified objects; and a characteristic analyzer configured to generate personalized characteristic information of the analysis target using a characteristic analysis result of each of the analysis ranges.
    Type: Grant
    Filed: December 28, 2015
    Date of Patent: December 12, 2017
    Assignee: SAMSUNG SDS CO., LTD.
    Inventors: Min-Woo Jung, Hyun-Jung Soh, Hye-Ran Lee, Tae-Hwan Jeong, Hyun-Chul Kim
  • Publication number: 20170344669
    Abstract: Methods for verifying error in digital circuit are provided, one of methods comprises, generating a first attribute value using metadata of a first digital circuit diagram, mechanically decomposing a digital circuit indicated by the first digital circuit diagram into individual elements, generating a second attribute value using the result of mechanical decomposition, and generating an attribute database comprising the first attribute value and the second attribute value by using an apparatus for verifying an error in a digital circuit, performing supervised learning using the attribute database to generate a pattern according to a verification purpose and generating a pattern database comprising the generated pattern by using the digital circuit error verification apparatus and generating a third attribute value and a fourth attribute value by analyzing a second digital circuit diagram, which is a target of error verification, in the same way as the first digital circuit diagram, generating verification requ
    Type: Application
    Filed: May 4, 2017
    Publication date: November 30, 2017
    Applicant: SAMSUNG SDS CO., LTD.
    Inventors: Min Woo JEONG, Tae Hwan JEONG, Hyun Jung SOH, Hye Ran LEE
  • Publication number: 20170124423
    Abstract: A system and method for analyzing a personalized characteristic are provided. The system includes an analysis range calculator configured to calculate a plurality of analysis ranges having different analysis times from positioning data according to a lapse of time of an analysis target; an image analyzer configured to identify one or more objects from the image data corresponding to each of the analysis ranges, and analyze one or more visual characteristics from each of the identified objects; and a characteristic analyzer configured to generate personalized characteristic information of the analysis target using a characteristic analysis result of each of the analysis ranges.
    Type: Application
    Filed: December 28, 2015
    Publication date: May 4, 2017
    Applicant: SAMSUNG SDS CO., LTD.
    Inventors: Min-Woo JUNG, Hyun-Jung SOH, Hye-Ran LEE, Tae-Hwan JEONG, Hyun-Chul KIM