Abstract: Provided is a system for manufacturing a secondary battery including: a positive electrode cell manufacturing line having a positive electrode single cell, on which a positive electrode tab is processed on one end of a positive electrode and a first separator is combined on one surface of the positive electrode, is continuously manufactured; a negative electrode cell manufacturing line having a negative electrode single cell, on which a negative electrode tab is processed on one end of a negative electrode and a second separator is combined on one surface of the negative electrode, is continuously manufactured; and a stacking part alternately receiving positive electrode single cells and negative electrode single cells respectively from the positive electrode cell manufacturing line and the negative electrode cell manufacturing line to stack the positive electrode single cells and the negative electrode single cells up to a predetermined layer, thereby forming a stack cell.

Abstract: A battery cell manufacturing apparatus includes rework automation equipment. The rework automation equipment is configured for measuring the quantity of reworked battery cells while automatically performing rework. The rework automation equipment is configured to automatically rework battery cells determined to be defective. A process for counting a quantity of reworked batteries uses the rework automation equipment.

Abstract: Provided is a system for manufacturing a secondary battery including: a positive electrode cell manufacturing line having a positive electrode single cell, on which a positive electrode tab is processed on one end of a positive electrode and a first separator is combined on one surface of the positive electrode, is continuously manufactured; a negative electrode cell manufacturing line having a negative electrode single cell, on which a negative electrode tab is processed on one end of a negative electrode and a second separator is combined on one surface of the negative electrode, is continuously manufactured; and a stacking part alternately receiving positive electrode single cells and negative electrode single cells respectively from the positive electrode cell manufacturing line and the negative electrode cell manufacturing line to stack the positive electrode single cells and the negative electrode single cells up to a predetermined layer, thereby forming a stack cell.

Abstract: A pillow may include a pillow form that includes a neck rest and a head rest, and a sleep controller that includes a body, at least one pair of vertically moving rods, and an actuating module configured to actuate the vertically moving rods.

Abstract: Provided is a scanning probe microscope capable of precisely analyzing characteristics of samples having an overhang surface structure. The scanning probe microscope comprises a first probe, a first scanner changing a position of the first probe along a straight line, and a second scanner changing a position of a sample in a plane, wherein the straight line in which the position of the first probe is changed by using the first scanner is non-perpendicular to the plane in which the position of the sample is changed by using the second scanner.

Abstract: A scanning probe microscope tilts the scanning direction of a z-scanner by a precise amount and with high repeatability using a movable assembly that rotates the scanning direction of the z-scanner with respect to the sample plane. The movable assembly is moved along a curved guide and has grooves that engage with corresponding projections on a stationary frame to precisely position the movable assembly at predefined locations along the curved guide.

Abstract: Provided are a scanning probe microscope (SPM) that prevents a distortion of an image caused by alignment errors of scanners and a method of measuring a sample using the same. The scanning probe microscope comprises a probe; a first scanner changing a position of the probe along a straight line; a second scanner changing a position of a sample in a plane; and an adjusting device adjusting a position of the second scanner or the first scanner so that the straight line where the position of the probe is changed using the first scanner is perpendicular to the plane in which the position of the sample is changed using the second scanner.

Abstract: Provided is a scanning probe microscope capable of precisely analyzing characteristics of samples having an overhang surface structure. The scanning probe microscope comprises a first probe, a first scanner changing a position of the first probe along a straight line, and a second scanner changing a position of a sample in a plane, wherein the straight line in which the position of the first probe is changed by using the first scanner is non-perpendicular to the plane in which the position of the sample is changed by using the second scanner.

Abstract: Provided are a scanning probe microscope (SPM) that prevents a distortion of an image caused by alignment errors of scanners and a method of measuring a sample using the same. The scanning probe microscope comprises a probe; a first scanner changing a position of the probe along a straight line; a second scanner changing a position of a sample in a plane; and an adjusting device adjusting a position of the second scanner or the first scanner so that the straight line where the position of the probe is changed using the first scanner is perpendicular to the plane in which the position of the sample is changed using the second scanner.