Abstract: A method and an apparatus for checking a pipelined parallel cyclic redundancy is disclosed. In accordance with the method and the apparatus of the present invention, after an entire CRC (cyclic redundancy check) logic is divided into a feedback portion and an input data portion, the input data portion is divided using a pipelined structure such that the input data portion is designed to have the pipelined structure based on an algorithm that maintains a logic level of each stage to be lower than that of the feedback portion and an algorithm that optimizes a size of a register inserted during the division to improve a speed thereof and to detect an error of a received data in a high speed data communication apparatus.

Abstract: An interconnect delay fault test controller and a test apparatus using the same wherein an update operation and a capture operation may be carried out in one interval of a system clock or a core clock when carrying out an interconnect delay fault test between an IEEE P1500 wrapped cores in a SoC as well as an interconnect wire on a board based on an IEEE 1149.1, and wherein the interconnect delay fault test using different system clocks or core clocks may be carried out simultaneously in one test cycle corresponding to each system clock or core clock even when multiple system clocks or core clocks exists is disclosed.

Abstract: A system-on-chip (SoC) test apparatus is disclosed. The system-on-chip (SoC) testing apparatus reduces a test time due to a small amount of overhead in the case of testing an AMBA-based system-on-chip (SoC) using a TIC, an EBI, and a Test Harness, and maintains AMBA- or TIC- compatibility simultaneously while performing scan input/output operations.

Abstract: Provided is a 4× framer/deframer module for PCI-Express and a framer/deframer device using the same. In the PCI-Express for high-rate data processing, delimiter and pad processing, and 4× framer shifting and arrangement/reverse arrangement for framing/deframing a frame format are performed to achieve a structure that facilitates reconfiguration and expansion, for example, a pipeline structure, so that the 4× framer/deframer module can operate without delay within a 250 MHz clock even when expansion to 32× is made.

Abstract: A system-on-chip (SoC) test apparatus is disclosed. The system-on-chip (SoC) testing apparatus reduces a test time due to a small amount of overhead in the case of testing an AMBA-based system-on-chip (SoC) using a TIC, an EBI, and a Test Harness, and maintains AMBA- or TIC- compatibility simultaneously while performing scan input/output operations.

Abstract: A method and an apparatus for checking a pipelined parallel cyclic redundancy is disclosed. In accordance with the method and the apparatus of the present invention, after an entire CRC (cyclic redundancy check) logic is divided into a feedback portion and an input data portion, the input data portion is divided using a pipelined structure such that the input data portion is designed to have the pipelined structure based on an algorithm that maintains a logic level of each stage to be lower than that of the feedback portion and an algorithm that optimizes a size of a register inserted during the division to improve a speed thereof and to detect an error of a received data in a high speed data communication apparatus.