Patents by Inventor Hyundo RYU

Hyundo RYU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD, COMPUTER DEVICE, AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM FOR PROCESSING INFORMATION AS TEMPORARY MESSAGE
    Publication number: 20240062243
    Abstract: A temporary message processing method includes, in response to an entry request from a user for entry into a chatroom, verifying whether the user has consented to receiving marketing information from a business operator related to the chatroom; and when the user has not consented to receiving marketing information, configuring a marketing message of the business operator in a form of a volatile temporary message and displaying the same in the chatroom.
    Type: Application
    Filed: August 18, 2023
    Publication date: February 22, 2024
    Inventors: Yu-Kyung SEO, Songi KU, Gayoung AHN, Hyerim OH, Dongseop LIM, Hyundo RYU, Changkyu AHN, Kyung Hee YOON, Chan Hye PARK, JeongMoon HEO
  • Method and apparatus for detecting circuit defects
    Patent number: 11709196
    Abstract: The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.
    Type: Grant
    Filed: July 16, 2021
    Date of Patent: July 25, 2023
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Donggyu Minn, Daehyun Kang, Yonghoon Kim, Jihoon Kim, Hyundo Ryu, Jeeho Park, Sunggi Yang, Youngchang Yoon, Sehyug Jeon
  • METHOD AND APPARATUS FOR DETECTING CIRCUIT DEFECTS
    Publication number: 20220018892
    Abstract: The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.
    Type: Application
    Filed: July 16, 2021
    Publication date: January 20, 2022
    Inventors: Donggyu MINN, Daehyun KANG, Yonghoon KIM, Jihoon KIM, Hyundo RYU, Jeeho PARK, Sunggi YANG, Youngchang YOON, Sehyug JEON