Abstract: An electronic device includes: a memory device; a nonvolatile memory configured to store a plurality of first configuration parameters respectively corresponding to operating voltages of the memory device and a plurality of second configuration parameters respectively corresponding to operating temperatures of the memory device; and a memory controller configured to: determine a value of a third configuration parameter corresponding to an operating voltage of the memory device among the plurality of first configuration parameters stored in the nonvolatile memory without performing a training operation, determine a value of a fourth configuration parameter corresponding to an operating temperature of the memory device among the plurality of second configuration parameters stored in the nonvolatile memory without performing the training operation, and drive the memory device according to the determined values of the third and the fourth configuration parameters.

Abstract: An electronic device includes: a memory device; a nonvolatile memory configured to store a plurality of first configuration parameters respectively corresponding to operating voltages of the memory device and a plurality of second configuration parameters respectively corresponding to operating temperatures of the memory device; and a memory controller configured to: determine a value of a third configuration parameter corresponding to an operating voltage of the memory device among the plurality of first configuration parameters stored in the nonvolatile memory without performing a training operation, determine a value of a fourth configuration parameter corresponding to an operating temperature of the memory device among the plurality of second configuration parameters stored in the nonvolatile memory without performing the training operation, and drive the memory device according to the determined values of the third and the fourth configuration parameters.

Abstract: Provided is a multi-chip package in which a plurality of semiconductor chips having different sizes are stacked. A multi-chip package may include a substrate, and a plurality of semiconductor chips stacked on the substrate, each of the plurality of semiconductor chips having a different size. Each of the plurality of semiconductor chips including a pad group and a reference region associated with the pad group, each pad group having a plurality of pads, and the plurality of pads in each pad group located at same coordinates with respect to the associated reference region, and each of the plurality of semiconductor chips having their reference regions vertically aligned.

Abstract: Provided is a multi-chip package in which a plurality of semiconductor chips having different sizes are stacked. A multi-chip package may include a substrate, and a plurality of semiconductor chips stacked on the substrate, each of the plurality of semiconductor chips having a different size. Each of the plurality of semiconductor chips including a pad group and a reference region associated with the pad group, each pad group having a plurality of pads, and the plurality of pads in each pad group located at same coordinates with respect to the associated reference region, and each of the plurality of semiconductor chips having their reference regions vertically aligned.

Abstract: Provided is a multi-chip package in which a plurality of semiconductor chips having different sizes are stacked. A multi-chip package may include a substrate, and a plurality of semiconductor chips stacked on the substrate, each of the plurality of semiconductor chips having a different size. Each of the plurality of semiconductor chips including a pad group and a reference region associated with the pad group, each pad group having a plurality of pads, and the plurality of pads in each pad group located at same coordinates with respect to the associated reference region, and each of the plurality of semiconductor chips having their reference regions vertically aligned.

Abstract: A stacked structure of semiconductor packages includes an upper semiconductor package, a lower semiconductor package and inter-package connectors. The upper semiconductor package includes an upper package substrate, a plurality of upper semiconductor chips stacked on the upper package substrate, and conductive upper connection lands formed on a bottom surface of the upper package substrate. The lower semiconductor package includes a lower package substrate, a plurality of lower semiconductor chips stacked on the lower package substrate, and lower through-silicon vias vertically penetrating the lower semiconductor chips. The inter-package connectors may electrically connect the through-silicon vias to the upper connection lands.

Abstract: A stacked structure of semiconductor packages includes an upper semiconductor package, a lower semiconductor package and inter-package connectors. The upper semiconductor package includes an upper package substrate, a plurality of upper semiconductor chips stacked on the upper package substrate, and conductive upper connection lands formed on a bottom surface of the upper package substrate. The lower semiconductor package includes a lower package substrate, a plurality of lower semiconductor chips stacked on the lower package substrate, and lower through-silicon vias vertically penetrating the lower semiconductor chips. The inter-package connectors may electrically connect the through-silicon vias to the upper connection lands.

Abstract: Provided is a semiconductor device package. The semiconductor device package includes: stacked semiconductor chips having bonding pads; a PCB (printed circuit board) mounting the stacked semiconductor chips thereon, and including bonding electrodes that correspond to the bonding pads; and interposers respectively covering the stacked semiconductor chips and interposed between the stacked semiconductor chips. The interposers comprise wire patterns connecting the bonding pads with the bonding electrodes, and connecting the interposers to each other.

Abstract: A stacked-type semiconductor device package is provided. The stacked-type semiconductor device package includes a plurality of stacked semiconductor chip packages with joining electrodes exposed on sides of the semiconductor chip packages and a flexible printed circuit board (flexible PCB) on which the stacked semiconductor chip packages are mounted. The flexible PCB includes a first surface having connecting electrodes corresponding to the joining electrodes of the stacked semiconductor chip packages and a second surface opposite the first surface. The flexible PCB covers the sides of the stacked semiconductor chip packages, and the connecting electrodes of the first surface are connected to the joining electrodes of the stacked semiconductor chip packages.

Abstract: A stacked-type semiconductor device package is provided. The stacked-type semiconductor device package includes a plurality of stacked semiconductor chip packages with joining electrodes exposed on sides of the semiconductor chip packages and a flexible printed circuit board (flexible PCB) on which the stacked semiconductor chip packages are mounted. The flexible PCB includes a first surface having connecting electrodes corresponding to the joining electrodes of the stacked semiconductor chip packages and a second surface opposite the first surface. The flexible PCB covers the sides of the stacked semiconductor chip packages, and the connecting electrodes of the first surface are connected to the joining electrodes of the stacked semiconductor chip packages.

Abstract: A semiconductor device and methods for protecting a semiconductor device. In an example, the semiconductor device may include a semiconductor substrate including at least one electrostatic discharge (ESD) protection device, at least one metal interconnection line connected to the at least one ESD protection device through a conductive plug and a passivation layer disposed on less than all of the metal interconnection line. In an example method, a semiconductor device may be protected by diverting at least a portion of an electron build-up from an accumulation point to one or more protective circuits along one or more conductive paths, the electron build-up, without the diverting, sufficient to cause an ESD at the accumulation point. In another example, a semiconductor device may be protected by exposing one or more conductive lines to a fuse opening to avoid an ESD by diverting an electron build-up at the fuse opening to one or more ESD protection devices.

Abstract: A stacked-type semiconductor device package is provided. The stacked-type semiconductor device package includes a plurality of stacked semiconductor chip packages with joining electrodes exposed on sides of the semiconductor chip packages and a flexible printed circuit board (flexible PCB) on which the stacked semiconductor chip packages are mounted. The flexible PCB includes a first surface having connecting electrodes corresponding to the joining electrodes of the stacked semiconductor chip packages and a second surface opposite the first surface. The flexible PCB covers the sides of the stacked semiconductor chip packages, and the connecting electrodes of the first surface are connected to the joining electrodes of the stacked semiconductor chip packages.

Abstract: A semiconductor chip may include a semiconductor substrate that may have a semiconductor device pattern. A passivation layer may be provided on a surface of the semiconductor substrate. At least one elastic protecting layer may be provided on the passivation layer. The elastic protecting layer may have a pattern composed of grooves formed on a surface.

Abstract: Provided is a semiconductor device package. The semiconductor device package includes: stacked semiconductor chips having bonding pads; a PCB (printed circuit board) mounting the stacked semiconductor chips thereon, and including bonding electrodes that correspond to the bonding pads; and interposers respectively covering the stacked semiconductor chips and interposed between the stacked semiconductor chips. The interposers comprise wire patterns connecting the bonding pads with the bonding electrodes, and connecting the interposers to each other.

Abstract: Provided is a multi-chip package in which a plurality of semiconductor chips having different sizes are stacked. A multi-chip package may include a substrate, and a plurality of semiconductor chips stacked on the substrate, each of the plurality of semiconductor chips having a different size. Each of the plurality of semiconductor chips including a pad group and a reference region associated with the pad group, each pad group having a plurality of pads, and the plurality of pads in each pad group located at same coordinates with respect to the associated reference region, and each of the plurality of semiconductor chips having their reference regions vertically aligned.

Abstract: A semiconductor chip may include a semiconductor substrate that may have a semiconductor device pattern. A passivation layer may be provided on a surface of the semiconductor substrate. At least one elastic protecting layer may be provided on the passivation layer. The elastic protecting layer may have a pattern composed of grooves formed on a surface.

Abstract: A semiconductor device and methods for protecting a semiconductor device. In an example, the semiconductor device may include a semiconductor substrate including at least one electrostatic discharge (ESD) protection device, at least one metal interconnection line connected to the at least one ESD protection device through a conductive plug and a passivation layer disposed on less than all of the metal interconnection line. In an example method, a semiconductor device may be protected by diverting at least a portion of an electron build-up from an accumulation point to one or more protective circuits along one or more conductive paths, the electron build-up, without the diverting, sufficient to cause an ESD at the accumulation point. In another example, a semiconductor device may be protected by exposing one or more conductive lines to a fuse opening to avoid an ESD by diverting an electron build-up at the fuse opening to one or more ESD protection devices.