Abstract: A display device includes: a substrate; a first conductive layer on the substrate and comprising a first signal line; an insulating layer pattern on the first conductive layer; a semiconductor pattern on the insulating layer pattern; a gate insulating layer on the semiconductor pattern; and a second conductive layer comprising a gate electrode on the gate insulting layer and a first source/drain electrode and a second source/drain electrode, each on at least a part of the semiconductor pattern, wherein the insulating layer pattern and the semiconductor pattern have a same planar shape, the semiconductor pattern comprises a channel region overlapping the gate electrode, a first source/drain region on a first side of the channel region and a second source/drain region on a second side of the channel region, and the first source/drain electrode electrically connects the first source/drain region and the first signal line.

Abstract: A method for selectively recovering a rare earth element (REE) from an alloy includes applying a potential of from -3.5 V to 0 V to an electrochemical cell comprising a anode, a cathode, and an electrolyte, wherein (i) the anode comprises an alloy comprising a REE, (ii) the cathode comprises a noble metal, and (iii) the electrolyte comprises an alkali metal or alkaline earth metal salt and a nonaqueous solvent. Under the applied potential, at least some of the REE is oxidatively dissolved from the anode and is electrodeposited onto the cathode to form an REE deposit.

Abstract: An anode active material comprises a silicon-carbon secondary particle comprising a composite having an exterior conformal carbon coating and formed of type I primary particles. Each type I primary particle comprises a core particle of interconnected silicon, the interconnected silicon formed of nano-sized silicon particles each connected to at least one other particle, inner pores internal to the core particle and defined by the interconnected silicon, an internal carbon coating on internal wall surfaces of the inner pores and a conformal carbon coating on the core particle.

Abstract: The present invention relates to a device for testing an angle of view of a camera. The present invention may comprise: a first light source which is arranged to face an image sensor, and has a first width and a second width longer than the first width; and a second light source and a third light source which are disposed on both sides of the image sensor in the direction of the first width, respectively. The present invention can inhibit an interference of the light source or a bracket supporting the light source by reducing the number of light sources. In addition, since it is possible to measure the angle of view of a camera by reducing the light sources, the present invention can reduce the manufacturing costs of a device for testing an angle of view of a camera.

Abstract: An anode active material comprises a silicon-carbon secondary particle comprising a composite having an exterior conformal carbon coating and formed of type I primary particles. Each type I primary particle comprises a core particle of interconnected silicon, the interconnected silicon formed of nano-sized silicon particles each connected to at least one other particle, inner pores internal to the core particle and defined by the interconnected silicon, an internal carbon coating on internal wall surfaces of the inner pores and a conformal carbon coating on the core particle.

Abstract: The present invention relates to a device for testing an angle of view of a camera. The present invention may comprise: a first light source which is arranged to face an image sensor, and has a first width and a second width longer than the first width; and a second light source and a third light source which are disposed on both sides of the image sensor in the direction of the first width, respectively. The present invention can inhibit an interference of the light source or a bracket supporting the light source by reducing the number of light sources. In addition, since it is possible to measure the angle of view of a camera by reducing the light sources, the present invention can reduce the manufacturing costs of a device for testing an angle of view of a camera.

Abstract: The present invention relates to a device for testing an angle of view of a camera. The present invention may comprise: a first light source which is arranged to face an image sensor, and has a first width and a second width longer than the first width; and a second light source and a third light source which are disposed on both sides of the image sensor in the direction of the first width, respectively. The present invention can inhibit an interference of the light source or a bracket supporting the light source by reducing the number of light sources. In addition, since it is possible to measure the angle of view of a camera by reducing the light sources, the present invention can reduce the manufacturing costs of a device for testing an angle of view of a camera.

Abstract: The present invention relates to a device for testing an angle of view of a camera. The present invention may comprise: a first light source which is arranged to face an image sensor, and has a first width and a second width longer than the first width; and a second light source and a third light source which are disposed on both sides of the image sensor in the direction of the first width, respectively. The present invention can prevent an interference of the light source or a bracket supporting the light source by reducing the number of light sources. In addition, since it is possible to measure the angle of view of a camera by reducing the light sources, the present invention can reduce the manufacturing costs of a device for testing an angle of view of a camera.

Abstract: A silicate phosphor composition is provided having a ?-phase of an orthorhombic crystal structure whose space group is Pbnm 62, and whose composition is represented by the following chemical formula: Ca2-x-y-zMxSiO4:yCe3+,zN(0?x<0.5,0<y?0.1,0?z<0.15) In the formula, M represents at least one member selected from the group consisting of Mg, Sr, Ba, Zn, Na, Al, Ga, Ge, P, As and Fe, and N represents at least one member selected from the group consisting of Eu2+, Mn2+, Tb3+, Yb2+ and Tm3+. The silicate phosphor has a maximum absorbance for a wavelength of about 450 nm to about 475 nm corresponding to a main part of a blue excitation light, and has a great stability at a high temperature. As such the silicate phosphor may be used in combination with a blue light source to produce a white light.