Abstract: The present invention relates to a composition including decursinol as an active ingredient for preventing or treating angina, arteriosclerosis, cerebral infarction, and hypertension. Poorly soluble decursinol was found to improve angina, arteriosclerosis, cerebral infarction, prostate hypertrophy, and diabetic hypertension by inhibiting the overgrowth of vascular endothelial cells, and is expected to be usable in the development of a composition for preventing or treating angina, arteriosclerosis, cerebral infarction, prostate hypertrophy, and diabetic hypertension.

Abstract: A memory device includes a memory cell array including memory cells; a row control circuit coupled to the memory cells through word lines and configured to apply, to a selected word line during read operations, respective read voltages having different levels; a page buffer circuit coupled to the memory cells through bit lines and configured to adjust, according to a sensing control signal during each of the read operations, an amount of current flowing through the bit lines to sense the adjusted amount; and a read control circuit configured to adjust, during a second read operation subsequent to a first read operation among the read operations, a voltage level of the sensing control signal when a voltage level of a second read voltage corresponding to the second read operation is different from a level of a first read voltage corresponding to the first read operation.

Abstract: A semiconductor memory apparatus includes: a page buffer circuit, a pass/fail determination circuit, and an operation control circuit. The page buffer circuit may include a sensing latch circuit and a data latch circuit. The pass/fail determination circuit determines a pass/fail for a memory cell. The operation control circuit controls a program operation and a program verify operation to be performed on the memory cell.

Abstract: An operating method of a non-volatile memory device includes simultaneously performing a program operation on a plurality of selection transistors included in a plurality of cell strings each including a corresponding selection transistor of the selection transistors and a plurality of memory cells, each of the cell strings being coupled between a common source line and a corresponding bit line of a plurality of bit lines; sequentially performing verification operations on respective groups of the selection transistors, the groups being coupled to respective selection lines; and sequentially storing results of the verification operations into respective data latch circuits within each of a plurality of page buffers coupled to the bit lines.

Abstract: Disclosed (or Provided) are a heterocyclic compound and an organic light emitting device including the same.

Abstract: An aerosol generating device according to an aspect comprises a main body that comprises a battery and a controller, a cartridge which is coupled to the main body and comprises a liquid storage that contains liquid composition and an atomization portion that generates an aerosol by heating the liquid composition contained in the liquid storage, and a cover that forms an inner space by being coupled to the main body such that the cartridge is arranged in the inner space, wherein the main body further comprises a light source that emits light toward an inside of the liquid storage, and the cover comprises a window hole through which light entitled from the light source toward the inside of the liquid storage is transmitted to the outside of the cover.

Abstract: A server according to an embodiment includes a processor configured to receive a friend add request for a target account from a user terminal accessed with a user account; based on one of the user account and the target account being a protected account, transmit an approval request for the friend add request to a protector account connected to the protected account; and based on receiving a reply to the approval request from the protector terminal, add the target account to a friend list of the user account.

Abstract: A memory device includes a controller that performs a program verification after a first program pulse is applied to the at least one non-volatile memory cell. The first program pulse is applied during a data program operation and the data program operation includes applying program pulses to program multi-bit data to the at least one non-volatile memory cell. The controller also determines a program mode for the at least one non-volatile memory cell based on a result of the program verification, and changes at least one of a level of a first control voltage based on the program mode. The first control voltage is applied to a drain select line coupled to the at least one non-volatile memory cell.

Abstract: A nonvolatile memory device includes: a peripheral circuit for repeatedly performing program loops each including a program operation including a setup operation on the plurality of bit lines and an application operation of applying a program pulse to a selected word line and the verification operation, and a control logic circuit for controlling the peripheral circuit, wherein the peripheral circuit performs a first program loop of the program loops by: applying each a first and a second program pulses in each a first and a second section of the application operation, setting a first bit line to a first level and a second bit line to a second level lower than the first level from a start of the setup operation until an end of the first section, and resetting the first and the second bit line to the second level in the second section.

Abstract: An operating method of a non-volatile memory device comprises: performing a foggy operation applying a first application voltage to a word line and applying a first verification voltage having a same level as or a higher level than a target threshold voltage to the word line, determining whether the foggy operation is completely performed according to whether a number of memory cells each having a threshold voltage higher than the first verification voltage is equal to or greater than a first number, performing a fine operation applying a second application voltage to the word line and applying a second verification voltage having the same level as the target threshold voltage, and determining whether the fine operation is completely performed, according to whether a number of memory cells each having a threshold voltage lower than the second verification voltage is less than or equal to a second number.

Abstract: A memory device includes a cell group and a control circuit. The cell group includes plural non-volatile memory cells capable of storing data. The control circuit performs a program operation for programming data in the plural non-volatile memory cells through a plurality of program loops, each program loop including a unit program operation for applying a program pulse to the plural non-volatile memory cells and a verification operation for verifying a result of the unit program operation. The control circuit uses a current detection circuit for detecting whether a threshold voltage distribution of the plural non-volatile memory cells satisfies a reference in a specific program loop of the plurality of program loops. The control circuit terminates the program operation after applying a preset program pulse to the plural non-volatile memory cells in a next program loop following the specific program loop.

Abstract: A memory device includes plural memory cells and control circuitry. Each of the memory cells is capable of storing multi-bit data corresponding to an erase state and plural program states. The control circuitry is configured to divide plural program loops, which are performed to store the multi-bit data in the plural memory cells, into plural program groups and apply different program pulses, which correspond to each of the plural program groups, to the plural memory cells.

Abstract: Provided herein may be a semiconductor memory device and a method of manufacturing the semiconductor memory device. The semiconductor memory device may include a stacked body including a plurality of interlayer insulating layers and a plurality of gate electrodes that are alternately stacked on a substrate, and a plurality of channel structures configured to vertically pass through the stacked body. Each of the plurality of channel structures may include a core insulating layer, a first channel layer, a second channel layer, a tunnel insulating layer, and a charge storage layer that extend vertically towards the substrate. Electron mobility of the first channel layer may be higher than electron mobility of the second channel layer.

Abstract: Provided herein is a memory device including a memory block with memory cells to which word lines and bit lines are connected; page buffers, connected to the memory block through the bit lines, during a program operation, configured to convert original data that is received from an external device into variable data that is divided into groups according to a number of specific data, and configured to apply a program enable voltage or a program inhibit voltage to the bit lines according to the variable data; and a data pattern manager configured to control the page buffers to convert the original data into the variable data during the program operation.

Abstract: A semiconductor device, and a method of operating the same, includes a memory cell array, a peripheral circuit, and control logic. The memory cell array includes a plurality of memory cells. The peripheral circuit is configured to perform a program operation on memory cells selected from among the plurality of memory cells. The control logic is configured to control the program operation of the peripheral circuit. The control logic is configured to control the peripheral circuit to precharge bit lines respectively coupled to the selected memory cells to different voltage levels during a verify operation included in the program operation.

Abstract: The present technology may include a voltage generation circuit configured to generate a plurality of voltages in response to at least one voltage control signal, and control logic configured to generate the at least one voltage control signal in order to adjust at least one of an under drive time and an under drive offset during an under drive operation of a semiconductor apparatus according to a temperature information signal and a pre-stored temperature characteristic signal of the semiconductor apparatus.

Abstract: A page buffer circuit including a data latch circuit and a sensing latch circuit. The data latch circuit configured to store data corresponding to a normal operation. The sensing latch circuit configured to receive and store the data in the data latch circuit in an entering operation in accordance with a suspend operation. The sensing latch circuit configured to transmit the data stored in the sensing latch circuit to the data latch circuit in a sensing operation in accordance with the suspend operation. The sensing latch circuit configured to suspend data in a memory cell, and to output the suspend data from the memory cell.

Abstract: A semiconductor apparatus includes a memory cell array and a control circuit. The control circuit is configured to perform a program operation on target cells within the memory cell array, the program operation including a plurality of loops. The control circuit may be configured to apply a bit line voltage having a predetermined level to bit lines in loops in which a pass voltage having a first level is applied among the plurality of loops, and configured to apply the bit line voltage having a higher level than the predetermined level to the bit lines in loops in which the pass voltage having a second level higher than the first level is applied among the plurality of loops.

Abstract: Provided herein is a page buffer, a semiconductor memory device with the page buffer, and a method of operating the semiconductor memory device. The page buffer includes a plurality of data latch components coupled to a sensing node, a bit line controller coupled between a bit line and the sensing node, the bit line controller configured to control a node value of the sensing node based on a program state of a memory cell that is coupled to the bit line during a program verify operation, and a sub-latch component configured to latch verification data based on the node value during the program verify operation, wherein each data latch component sets the node value to a first logic value when a program state that corresponds to program data has a threshold voltage distribution that is higher than that in a target program state during the program verify operation.

Abstract: A memory device, and a method of operating the same, includes a plurality of memory cells coupled to a plurality of word lines, a peripheral circuit configured to perform a program operation of storing data in the plurality of memory cells, a weak word line information storage configured to store information about a weak word line among the plurality of word lines, and a program operation controller configured to control the peripheral circuit such that the program operation is performed in a first program mode or a second program mode depending on a result of determining whether a selected word line corresponding to an address provided from a memory controller is a weak word line by comparing word lines based on the information about the weak word line.