Patents by Inventor Hyungjong Bae

Hyungjong Bae has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11960212
    Abstract: An operating method of an extreme ultraviolet (EUV) lithography device includes defining a target image to render an illumination system, assigning priorities to respective positions of facets of a pupil facet mirror corresponding to the target image, assigning a mirror according to the assigned priorities using linear programming, generating the illumination system by selecting one of the facets of the pupil facet mirror based on a symmetry criterion, and converting mirror assignment information and source map information corresponding to the selected facet into a form recognizable by an EUV scanner.
    Type: Grant
    Filed: December 23, 2022
    Date of Patent: April 16, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hoduk Cho, Seongbo Shim, Hyungjong Bae, Chan Hwang
  • Publication number: 20240027890
    Abstract: A reflective mask used in an EUV exposure process includes a mask substrate, a reflective layer on the mask substrate, and an absorption layer on the reflective layer. The reflective mask includes a main region, an out-of-band region surrounding the main region, and an alignment mark region outside a periphery of the out-of-band region. The absorption layer in the alignment mark region includes an alignment mark and an anti-reflection pattern adjacent the alignment mark, and the anti-reflection pattern includes line-and-space patterns having a predetermined line width in the alignment mark region.
    Type: Application
    Filed: March 8, 2023
    Publication date: January 25, 2024
    Inventors: Hyungjong Bae, Hyun Jung Hwang, Heebom Kim, Seong-Bo Shim, Seungyoon Lee, Woo-Yong Jung, Chan Hwang
  • Publication number: 20230393484
    Abstract: An operating method of an extreme ultraviolet (EUV) lithography device includes defining a target image to render an illumination system, assigning priorities to respective positions of facets of a pupil facet mirror corresponding to the target image, assigning a mirror according to the assigned priorities using linear programming, generating the illumination system by selecting one of the facets of the pupil facet mirror based on a symmetry criterion, and converting mirror assignment information and source map information corresponding to the selected facet into a form recognizable by an EUV scanner.
    Type: Application
    Filed: December 23, 2022
    Publication date: December 7, 2023
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hoduk CHO, Seongbo Shim, Hyungjong Bae, Chan Hwang
  • Patent number: 10557846
    Abstract: Provided are encoded polymeric microparticles and a multiplexed bioassay using the encoded polymeric microparticles. Each of the encoded polymeric microparticles includes an encoded polymeric microparticle core and a silica shell surrounding the microparticle core. Further provided is a method for producing encoded polymeric microparticles. The method includes: mixing a photocurable material with a linker having a functional group polymerizable with the photocurable material and an alkoxysilyl group; applying patterned energy to cure the mixture, followed by encoding to obtain encoded polymeric microparticle cores; and treating the encoded polymeric microparticle cores with a silica precursor to form a silica shell on each encoded polymeric microparticle core.
    Type: Grant
    Filed: November 18, 2013
    Date of Patent: February 11, 2020
    Assignee: QUANTAMATRIX INC.
    Inventors: Sunghoon Kwon, Mira Kim, Jisung Jang, Hyungjong Bae, Nari Kim