Patents by Inventor Hyun-Sub Earm

Hyun-Sub Earm has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7531792
    Abstract: In an analyzing chamber for a mass analyzer, a body of the analyzing chamber may include an inlet through which an ion beam enters and an outlet through which the ion beam leaves. A shielding section may be installed on a sidewall. The shielding section may prevent the ion beam traveling along a path in the body from causing damage to the sidewall of the body. A detector may be interposed between the sidewall of the body and the shielding section. The detector may detect an ion beam leaking through the shielding section. Accordingly, damage to the sidewall of the body may be sufficiently reduced and/or prevented.
    Type: Grant
    Filed: July 20, 2006
    Date of Patent: May 12, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyun-Sub Earm, Seung-Se Lee, Young-Dae Kim, Gon-Su Kang, Sung-Yeul An
  • Publication number: 20070018093
    Abstract: In an analyzing chamber for a mass analyzer, a body of the analyzing chamber may include an inlet through which an ion beam enters and an outlet through which the ion beam leaves. A shielding section may be installed on a sidewall. The shielding section may prevent the ion beam traveling along a path in the body from causing damage to the sidewall of the body. A detector may be interposed between the sidewall of the body and the shielding section. The detector may detect an ion beam leaking through the shielding section. Accordingly, damage to the sidewall of the body may be sufficiently reduced and/or prevented.
    Type: Application
    Filed: July 20, 2006
    Publication date: January 25, 2007
    Inventors: Hyun-Sub Earm, Seung-Se Lee, Young-Dae Kim, Gon-Su Kang, Sung-Yeul An