Patents by Inventor I-Chung Chang

I-Chung Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240085322
    Abstract: The present invention relates to an optical system for triglyceride inspection partially integrated into a toilet seat and comprising a plurality of optical sensor modules and a controlling and processing module, wherein each said optical sensor module comprises a first light source, a second light source and an optical sensor. The optical sensor receives light signals generated by the first and second light sources respectively on the skin of the person (especially the skin of the thighs) to be tested and thereby generates a sensing signal of an adaptive calibration function. The sensing signal is then converted by the controlling and processing module into an inspection value of triglyceride, which is transmitted to a display unit. With the above optical system for triglyceride inspection, triglycerides can be inspected automatically without invasive blood sampling, making the system a convenient home health monitoring device.
    Type: Application
    Filed: September 8, 2022
    Publication date: March 14, 2024
    Applicant: Taiwan RedEye Biomedical Inc.
    Inventors: Shuo-Ting Yan, I-Hua Wang, Chen-Chung Chang
  • Patent number: 7011754
    Abstract: A filtering device includes a container, a cover attached on top of the container having a space communicating with an inlet opening and a chamber of the container, and a filter screen received in the container for filtering the fluid from the inlet opening to the chamber of the container. The filter screen includes an upper peripheral flange having a peripheral wall or a peripheral flap for making an excellent seal between the container and the cover. The space of the cover includes a changing volume for decreasing the flowing speed of the fluid.
    Type: Grant
    Filed: June 25, 2002
    Date of Patent: March 14, 2006
    Inventor: I-Chung Chang
  • Publication number: 20030234215
    Abstract: A filtering device includes a container, a cover attached on top of the container having a space communicating with an inlet opening and a chamber of the container, and a filter screen received in the container for filtering the fluid from the inlet opening to the chamber of the container. The filter screen includes an upper peripheral flange having a peripheral wall or a peripheral flap for making an excellent seal between the container and the cover. The space of the cover includes a changing volume for decreasing the flowing speed of the fluid.
    Type: Application
    Filed: June 25, 2002
    Publication date: December 25, 2003
    Inventor: I-Chung Chang
  • Patent number: 6507394
    Abstract: An optical inspection system for detecting defects on the surface of a semiconductor wafer includes two light sources and two light receivers mounted as a common assembly which is rotated such that two curtains of light and corresponding linear photosensor arrays circularly scan the wafer surface. The reflected light is analyzed to determine the presence of surface defects. Marks applied to the wafer surface provide amplitude and timing references used to adjust and synchronize the analyzed signals.
    Type: Grant
    Filed: November 30, 1999
    Date of Patent: January 14, 2003
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Kun-Pi Cheng, I-Chung Chang
  • Patent number: 6396567
    Abstract: The two dimensional intensity profile of radiation applied to a semiconductor wafer during photolithography is controlled by passing the radiation beam through an attenuating member before the beam is imaged by a mask onto the wafer. The attenuating member is preferably ring shaped and is formed of a semi-transparent material such as Mo Bi Si O4, or a material that is partially reflective of the radiation.
    Type: Grant
    Filed: June 2, 1999
    Date of Patent: May 28, 2002
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd
    Inventors: Tsu-Yu Chu, I-Chung Chang, Kun-Pi Cheng
  • Patent number: 6357131
    Abstract: A method of overlaying two images and from this overlay observe and measure the accuracy of the alignment of the wafer. Wafer misalignment can be readily corrected based on the results of these observations. Alignment marks are provided on the surface of the wafer that is being validated for accuracy of alignment. The position of this mark relative to a pattern provided on the surface of a control wafer is measured and forms an indication of the alignment of the wafer.
    Type: Grant
    Filed: December 20, 1999
    Date of Patent: March 19, 2002
    Assignee: Taiwan Semiconductor Manufacturing Company
    Inventors: Kun Pi Cheng, I-Chung Chang